Bahrebar, Sajjad
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1

Probability of Failure due to Electrochemical Migration on ..:

, In: 2023 IMAPS Nordic Conference on Microelectronics Packaging (NordPac),
Bahrebar, Sajjad ; Ambat, Rajan - p. 1-9 , 2023
 
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3

Time to Failure Prediction on a Printed Circuit Board Surfa..:

Bahrebar, Sajjad ; Ambat, Rajan
Journal of Electronic Materials.  51 (2022)  8 - p. 4388-4406 , 2022
 
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10

Investigating the solder mask defects impact on leakage cur..:

Zhang, Kaichen ; Bahman, Amir Sajjad ; Iannuzzo, Francesco...
https://orbit.dtu.dk/en/publications/9f307057-6238-43a8-8361-237c34c0009c.  , 2023
 
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11

Probability of Failure due to Electrochemical Migration on ..:

Bahrebar, Sajjad ; Ambat, Rajan
https://orbit.dtu.dk/en/publications/846c94aa-acdb-459b-9981-73e68a98e2e6.  , 2023
 
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12

Investigating the solder mask defects impact on leakage cur..:

Zhang, Kaichen ; Bahman, Amir Sajjad ; Iannuzzo, Francesco...
https://vbn.aau.dk/da/publications/d38ea5fc-a027-441c-87db-b384673d52a9.  , 2023
 
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13

Managing Corrosion in CCS: Insights from L80-1Cr Steel Tubi..:

Singh, Suraj ; Bahrebar, Sajjad ; Ingle, Avinash..
https://orbit.dtu.dk/en/publications/d8c3c611-a4ab-474a-a4d1-684cdf62d927.  , 2023
 
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14

Climatic Reliability of Electronics: Prediction of PCB Fail..:

Bahrebar, Sajjad
Bahrebar , S 2022 , Climatic Reliability of Electronics: Prediction of PCB Failure under Humidity using Predictive Analytics . Technical University of Denmark , Kgs. Lyngby ..  , 2022
 
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15

Using Machine Learning Algorithms to Predict Failure on the..:

Bahrebar, Sajjad ; Homayoun, Sajad ; Ambat, Rajan
https://orbit.dtu.dk/en/publications/e93c6027-73d1-440c-a82d-7840bfc7ac32.  , 2022
 
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