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Bai, Runhao
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1

The characteristics and influencing factors of farmland soi..:

Bai, Runhao ; Liu, Hongjin ; Cui, Jixiao...
Journal of Hazardous Materials.  465 (2024)  - p. 133472 , 2024
Link: https://doi.org/10.1016/..
 
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2

The reciprocity principle in mulch film deterioration and m..:

Bai, Runhao ; Li, Zhen ; Liu, Qin...
Environmental Science: Processes & Impacts.  26 (2024)  1 - p. 8-15 , 2024
Link: https://doi.org/10.1039/..
 
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3

Potential agricultural contamination and environmental risk..:

Cui, Jixiao ; Bai, Runhao ; Ding, Weili...
Journal of Environmental Chemical Engineering.  12 (2024)  1 - p. 111785 , 2024
Link: https://doi.org/10.1016/..
 
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4

Comparative evaluation of soil accumulation of light stabil..:

Fan, Ruiqi ; Li, Bingru ; Liu, Qi...
Journal of Hazardous Materials.  465 (2024)  - p. 133302 , 2024
Link: https://doi.org/10.1016/..
 
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5

Microplastics are overestimated due to poor quality control..:

Bai, Runhao ; Fan, Ruiqi ; Xie, Changhong...
Journal of Hazardous Materials.  459 (2023)  - p. 132068 , 2023
Link: https://doi.org/10.1016/..
 
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6

Kinetics of microplastic generation from different types of..:

Yang, Yang ; Li, Zhen ; Yan, Changrong...
Science of The Total Environment.  814 (2022)  - p. 152572 , 2022
Link: https://doi.org/10.1016/..
 
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7

Flexible triboelectric sensor array based on 3D printed bea..:

Wang, Shiyi ; Zeng, Runhao ; Ding, Xinrui...
Nano Energy.  122 (2024)  - p. 109318 , 2024
Link: https://doi.org/10.1016/..
 
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8

Enlargement of Memory Window of Si Channel FeFET by Inserti..:

Hu, Tao ; Sun, Xiaoqing ; Bai, Mingkai...
IEEE Electron Device Letters.  45 (2024)  5 - p. 825-828 , 2024
Link: https://doi.org/10.1109/..
 
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9

Regulating ferroelectricity in Hf0.5Zr0.5O2 thin films: Exp..:

Bai, Mingkai ; Hong, Peizhen ; Han, Runhao...
Journal of Applied Physics.  134 (2023)  17 - p. , 2023
Link: https://doi.org/10.1063/..
 
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10

Understanding the stress effect of TiN top electrode on fer..:

Han, Runhao ; Hong, Peizhen ; Zhang, Bao...
Journal of Applied Physics.  134 (2023)  19 - p. , 2023
Link: https://doi.org/10.1063/..
 
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11

Corrigendum: The influence of lightly-doped p-GaN cap layer..:

Liu, Kai ; Wang, Runhao ; Wang, Chong...
Semiconductor Science and Technology.  37 (2022)  8 - p. 089501 , 2022
Link: https://doi.org/10.1088/..
 
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12

The influence of lightly doped p-GaN cap layer on p-GaN/AlG..:

Liu, Kai ; Wang, Runhao ; Wang, Chong...
Semiconductor Science and Technology.  37 (2022)  7 - p. 075005 , 2022
Link: https://doi.org/10.1088/..
 
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13

Enlargement of Memory Window of Si Channel FeFET by Inserti..:

Hu, Tao ; Sun, Xiaoqing ; Bai, Mingkai...
http://arxiv.org/abs/2312.16829.  , 2023
Link: http://arxiv.org/abs/231..
 
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