Balakrishnan, V.R.
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1

Two-dimensional analytical modelling of drain current colla..:

Gupta, Shradha ; Kaushik, J K ; Gupta, Ankur..
Semiconductor Science and Technology.  35 (2020)  8 - p. 085035 , 2020
 
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3

Inverse temperature dependence of reverse gate leakage curr..:

Kaushik, J K ; Balakrishnan, V R ; Panwar, B S.
Semiconductor Science and Technology.  28 (2012)  1 - p. 015026 , 2012
 
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7

Carrier multiplication in nanoparticle PbSe/single crystal ..:

Bhardwaj, Asha ; Balakrishnan, V R ; Srivastava, P.
Semiconductor Science and Technology.  23 (2008)  9 - p. 095020 , 2008
 
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10

Dependence of dc and ac conduction on the pre-sintering tem..:

Roy, Somnath C. ; Sharma, G.L. ; Bhatnagar, M.C....
Materials Chemistry and Physics.  100 (2006)  2-3 - p. 404-410 , 2006
 
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11

The origin of low-frequency negative transconductance dispe..:

Balakrishnan, V R ; Kumar, Vikram ; Ghosh, Subhasis
Semiconductor Science and Technology.  20 (2005)  8 - p. 783-787 , 2005
 
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13

Interlayer formation due to group V-hydride stabilization d..:

Knauer, A ; Krispin, P ; Balakrishnan, V R..
Semiconductor Science and Technology.  19 (2004)  6 - p. 680-684 , 2004
 
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15

Deposition of nanosized grains of ferroelectric lead zircon..:

Gupta, Ruby ; Srivastava, M P ; Balakrishnan, V R..
Journal of Physics D: Applied Physics.  37 (2004)  7 - p. 1091-1094 , 2004
 
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