Balasch, Josep
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1

Time Sharing - A Novel Approach to Low-Latency Masking:

Kumar S. V., Dilip ; Dhooghe, Siemen ; Balasch, Josep..
IACR Transactions on Cryptographic Hardware and Embedded Systems.  2024 (2024)  3 - p. 249-272 , 2024
 
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2

Efficient Software Masking of AES through Instruction Set E..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Cui, Songqiao ; Balasch, Josep - p. 1-6 , 2023
 
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3

Low-Cost First-Order Secure Boolean Masking in Glitchy Hard..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
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4

On the Unpredictability of SPICE Simulations for Side-Chann..:

, In: 2023 60th ACM/IEEE Design Automation Conference (DAC),
 
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5

Constructive Side-Channel Analysis and Secure Design: 13th .. 

Lecture Notes in Computer Science, 13211
Balasch, Josep ; O'Flynn, Colin - 1st ed. 2022 . , 2022
 
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6

A Side-Channel-Resistant Implementation of SABER:

Beirendonck, Michiel Van ; D'anvers, Jan-Pieter ; Karmakar, Angshuman..
ACM Journal on Emerging Technologies in Computing Systems (JETC).  17 (2021)  2 - p. 1-26 , 2021
 
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7

A Side-Channel-Resistant Implementation of SABER:

Beirendonck, Michiel Van ; D'anvers, Jan-Pieter ; Karmakar, Angshuman..
ACM Journal on Emerging Technologies in Computing Systems.  17 (2021)  2 - p. 1-26 , 2021
 
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8

Towards efficient and automated side-channel evaluations at..:

Šijačić, Danilo ; Balasch, Josep ; Yang, Bohan..
Journal of Cryptographic Engineering.  10 (2020)  4 - p. 305-319 , 2020
 
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9

Side-channel countermeasures utilizing dynamic logic reconf..:

Socha, Petr ; Brejník, Jan ; Balasch, Josep..
Microprocessors and Microsystems.  78 (2020)  - p. 103208 , 2020
 
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10

Sweeping for leakage in masked circuit layouts:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
 
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11

Design and Evaluation of a Spark Gap Based EM-fault Injecti..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
 
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12

Sweeping for Leakage in Masked Circuit Layouts:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
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13

Design Considerations for EM Pulse Fault Injection:

, In: Smart Card Research and Advanced Applications; Lecture Notes in Computer Science,
 
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14

An In-Depth and Black-Box Characterization of the Effects o..:

, In: Smart Card Research and Advanced Applications; Lecture Notes in Computer Science,
 
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15

Characterization of EM faults on ATmega328p:

, In: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC),
 
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