Balestra, Luigi
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1

Characterization and TCAD Modeling of the Lateral Space Cha..:

Balestra, Luigi ; Gnani, Elena ; Rossetti, Mattia..
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2565-2569 , 2024
 
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2

Characterization and TCAD Simulation of the Electrostatic P..:

, In: 2024 IEEE Latin American Electron Devices Conference (LAEDC),
 
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3

Understanding the role of encapsulation layers under wet co..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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TCAD study of the Holding-Voltage Modulation in Irradiated ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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13

Numerical Investigation of the Leakage Current and Blocking..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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