E-LIB Suche - Ergebnisse für: Ball, J. R.

1

Transsexualism and Transvestitism (II):

Ball, J. R. R.
Australian & New Zealand Journal of Psychiatry. 2 (1968) 1 - p. 24-32 , 1968

Link: https://doi.org/10.3109/..

2

Single-Event Burnout in Vertical β-Ga₂O₃ Diodes With Pt/PtO..:

Islam, S. ; Senarath, A. S. ; Farzana, E....
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 515-521 , 2024

Link: https://doi.org/10.1109/..

3

Single-event burnout in homojunction GaN vertical PiN diode..:

Senarath, A. S. ; Islam, S. ; Sengupta, A....
Applied Physics Letters. 124 (2024) 13 - p. , 2024

Link: https://doi.org/10.1063/..

4

Synergistic effect of fibres on the physical, mechanical, a..:

Pedroso, M. ; Flores-Colen, I. ; Silvestre, J.D....
Cement and Concrete Composites. 139 (2023) - p. 105045 , 2023

Link: https://doi.org/10.1016/..

5

Effects of Collected Charge and Drain Area on SE Response o..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Pieper, N.J. ; Xiong, Y. ; Ball, D.R... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

6

Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Nod:

Pieper, Nicholas J. ; Xiong, Yoni ; Feeley, Alexandra...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 401-409 , 2023

Link: https://doi.org/10.1109/..

7

Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxid..:

Cadena, R. M. ; Ball, D. R. ; Zhang, E. X....
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 363-369 , 2023

Link: https://doi.org/10.1109/..

8

Single-Event Upsets for Single-Port and Two-Port SRAM Cells..:

Pieper, N. J. ; Xiong, Y. ; Pasternak, J....
IEEE Transactions on Nuclear Science. 70 (2023) 8 - p. 1673-1679 , 2023

Link: https://doi.org/10.1109/..

9

Design and fabrication of an axial neutron flux profile mea..:

Reichenberger, M.A. ; Holtz, M.R. ; Nichols, D....
EPJ Web of Conferences. 288 (2023) - p. 04006 , 2023

Link: https://doi.org/10.1051/..

10

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Xiong, Y. ; Feeley, A. ; Pieper, N. J.... - p. 7C.3-1-7C.3-7 , 2022

Link: https://doi.org/10.1109/..

11

Single-Event Latchup Vulnerability at the 7-nm FinFET Node:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Pieper, N. J. ; Xiong, Y. ; Feeley, A... - p. 5C.2-1-5C.2-6 , 2022

Link: https://doi.org/10.1109/..

12

In Situ Measurement of TID-Induced Leakage Using On-Chip Fr..:

Vibbert, S. T. ; Watkins, A. C. ; D'Amico, J. V....
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 367-373 , 2022

Link: https://doi.org/10.1109/..

13

SE Performance of D-FF Designs With Different VT Options at..:

Feeley, A. ; Xiong, Y. ; Pieper, N. J...
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1582-1586 , 2022

Link: https://doi.org/10.1109/..

14

Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Sh..:

Watkins, A. C. ; Vibbert, S. T. ; D'Amico, J. V....
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 374-380 , 2022

Link: https://doi.org/10.1109/..

15

The impact of Covid-19 on the well-being of young people wi..:

Bull, M. ; Livanou, M. ; Ball, R.
European Psychiatry. 65 (2022) S1 - p. S337-S338 , 2022

Link: https://doi.org/10.1192/..