I agree that this site is using cookies. You can find further informations here.
X
Banchhor, Shashank
21  results:
Search for persons X
?
1

Self-Heating Induced Reliability Issues and Revealing Early..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Kumar, Amit ; Banchhor, Shashank ; Pal, Pradyum... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Demonstration of a Junctionless Negative Capacitance FinFET..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Gandhi, Navneet ; Jaisawal, Rajeewa Kumar ; Rathore, Sunil... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
3

Self-Heating and Interface Traps Assisted Early Aging Revel..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Jaisawal, Rajeewa Kumar ; Rathore, Sunil ; Gandhi, Navneet... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
4

A New Insight into the Saturation Phenomenon in Nanosheet T..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Banchhor, Shashank ; Bagga, Navjeet ; Chauhan, Nitanshu... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
?
5

Self-Heating Aware Threshold Voltage Modulation Conforming ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Rathore, Sunil ; Jaisawal, Rajeewa Kumar ; Kondekar, P. N.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
?
6

Noise Analysis in FinFET-based Analog Circuit with Technolo..:

, In: 2023 IEEE Devices for Integrated Circuit (DevIC),
Patil, Mallikarjun ; Jaisawal, Rajeewa Kumar ; Banchhor, Shashank... - p. 486-489 , 2023
Link: https://doi.org/10.1109/..
 
?
7

Symmetric/Asymmetric Spacer Optimization for Multi Fin FinF..:

, In: 2022 IEEE International Conference on Emerging Electronics (ICEE),
Patel, Jyoti ; Bagga, Navjeet ; Banchhor, Shashank. - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
?
8

Through-silicon-via induced stress aware FinFET buffer sizi..:

Yadav, Sarita ; Chauhan, Nitanshu ; Chawla, Raghav...
Semiconductor Science and Technology.  , 2022
Link: https://doi.org/10.1088/..
 
?
9

Negative-to-Positive Differential Resistance Transition in ..:

Chauhan, Nitanshu ; Bagga, Navjeet ; Banchhor, Shashank...
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control.  69 (2022)  1 - p. 430-437 , 2022
Link: https://doi.org/10.1109/..
 
?
10

Design optimization Using Symmetric/Asymmetric Spacer for 1..:

, In: 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID),
Patel, Jyoti ; Banchhor, Shashank ; Guglani, Surila... - p. 292-296 , 2022
Link: https://doi.org/10.1109/..
 
?
11

Impact of Random Spatial Fluctuation in Non-Uniform Crystal..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Chauhan, Nitanshu ; Garg, Chirag ; Ni, Kai... - p. P23-1-P23-6 , 2022
Link: https://doi.org/10.1109/..
 
?
12

Unveiling the Impact of Interface Traps Induced on Negative..:

, In: Communications in Computer and Information Science; VLSI Design and Test,
Gupta, Aniket ; Bajpai, Govind ; Bagga, Navjeet... - p. 85-96 , 2022
Link: https://doi.org/10.1007/..
 
?
13

Analysis and Modeling of Leakage Currents in Stacked Gate-A..:

, In: 2022 IEEE International Conference on Emerging Electronics (ICEE),
Manikandan, S. ; Chauhan, Nitanshu ; Bagga, Navjeet... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
?
14

A physical insight into variation aware minimum V DD for de..:

Yadav, Sarita ; Chauhan, Nitanshu ; Tyagi, Shobhit...
Semiconductor Science and Technology.  36 (2021)  12 - p. 125002 , 2021
Link: https://doi.org/10.1088/..
 
?
15

A new physical insight into the zero-temperature coefficien..:

Banchhor, Shashank ; Chauhan, Nitanshu ; Anand, Bulusu
Semiconductor Science and Technology.  36 (2021)  3 - p. 035005 , 2021
Link: https://doi.org/10.1088/..
 
1-15