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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Self-Heating Induced Reliability Issues and Revealing Early..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Demonstration of a Junctionless Negative Capacitance FinFET..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
3
Self-Heating and Interface Traps Assisted Early Aging Revel..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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A New Insight into the Saturation Phenomenon in Nanosheet T..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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Self-Heating Aware Threshold Voltage Modulation Conforming ..:
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2023 IEEE Devices for Integrated Circuit (DevIC) ,
6
Noise Analysis in FinFET-based Analog Circuit with Technolo..:
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2022 IEEE International Conference on Emerging Electronics (ICEE) ,
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Symmetric/Asymmetric Spacer Optimization for Multi Fin FinF..:
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2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) ,
10
Design optimization Using Symmetric/Asymmetric Spacer for 1..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Impact of Random Spatial Fluctuation in Non-Uniform Crystal..:
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Communications in Computer and Information Science; VLSI Design and Test ,
12
Unveiling the Impact of Interface Traps Induced on Negative..:
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2022 IEEE International Conference on Emerging Electronics (ICEE) ,
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