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Bang, Tewook
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1

Lateral profiling of gate dielectric damage by off-state st..:

Lee, Geon-Beom ; Kim, Choong-Ki ; Bang, Tewook..
Microelectronics Reliability.  127 (2021)  - p. 114383 , 2021
Link: https://doi.org/10.1016/..
 
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2

Analysis of damage curing in a MOSFET with joule heat gener..:

Lee, Geon-Beom ; Kim, Choong-Ki ; Bang, Tewook...
Microelectronics Reliability.  104 (2020)  - p. 113548 , 2020
Link: https://doi.org/10.1016/..
 
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3

Electrothermal Annealing (ETA) Method to Enhance the Electr..:

Kim, Choong-Ki ; Kim, Eungtaek ; Lee, Myung Keun...
ACS Applied Materials & Interfaces.  8 (2016)  36 - p. 23820-23826 , 2016
Link: https://doi.org/10.1021/..
 
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4

Influence of the charge trap density distribution in a gate..:

Kim, Eungtaek ; Kim, Choong-Ki ; Lee, Myung Keun...
Applied Physics Letters.  108 (2016)  18 - p. , 2016
Link: https://doi.org/10.1063/..
 
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5

Vertically Integrated ZRAM toward Extremely Scaled Memory:

Lee, Byung-Hyun ; Ahn, Dae-Chul ; Kang, Min-Ho...
ECS Transactions.  75 (2016)  5 - p. 311-316 , 2016
Link: https://doi.org/10.1149/..
 
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6

Impact of crystalline damage on a vertically integrated jun..:

Ahn, Dae-Chul ; Lee, Byung-Hyun ; Kang, Min-Ho...
Applied Physics Letters.  109 (2016)  18 - p. , 2016
Link: https://doi.org/10.1063/..
 
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7

A Vertically Integrated Junctionless Nanowire Transistor:

Lee, Byung-Hyun ; Hur, Jae ; Kang, Min-Ho...
Nano Letters.  16 (2016)  3 - p. 1840-1847 , 2016
Link: https://doi.org/10.1021/..
 
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8

Vertically Integrated Multiple Nanowire Field Effect Transi..:

Lee, Byung-Hyun ; Kang, Min-Ho ; Ahn, Dae-Chul...
Nano Letters.  15 (2015)  12 - p. 8056-8061 , 2015
Link: https://doi.org/10.1021/..
 
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