Bano, Edwige
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New Insights using Avalanche Mode for On-wafer Evaluation o..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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12

Interdependence of piezoelectric coefficient and film thick..:

Verma, Anjneya ; Panayanthatta, Namanu ; Ichangi, Arun...
Journal of the American Ceramic Society.  104 (2021)  5 - p. 1966-1977 , 2021
 
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