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Barcz, Adam
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1

Investigation of diffusion mechanism of beryllium in GaN:

Jakiela, Rafal ; Sierakowski, Kacper ; Sochacki, Tomasz...
Physica B: Condensed Matter.  594 (2020)  - p. 412316 , 2020
Link: https://doi.org/10.1016/..
 
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2

Damage-induced voltage alteration (DIVA) contrast in SEM im..:

Jóźwik, Iwona ; Barcz, Adam ; Dąbrowska, Elżbieta..
Ultramicroscopy.  204 (2019)  - p. 6-9 , 2019
Link: https://doi.org/10.1016/..
 
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3

Diffusion of Mn in gallium nitride: Experiment and modellin:

Jakiela, Rafal ; Gas, Katarzyna ; Sawicki, Maciej.
Journal of Alloys and Compounds.  771 (2019)  - p. 215-220 , 2019
Link: https://doi.org/10.1016/..
 
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4

SIMS accurate determination of matrix composition of topolo..:

Jakieła, Rafał ; Galicka, Marta ; Dziawa, Piotr..
Surface and Interface Analysis.  52 (2019)  3 - p. 71-75 , 2019
Link: https://doi.org/10.1002/..
 
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5

Ion-Irradiated Damage in Semiconductors Visualized by Means..:

Jozwik, Iwona ; Barcz, Adam ; Dumiszewska, Ewa.
Microscopy and Microanalysis.  25 (2019)  S2 - p. 486-487 , 2019
Link: https://doi.org/10.1017/..
 
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6

Electrical isolation of GaAs and AlGaAs/GaAs Quantum Cascad..:

Kozubal, Maciej Artur ; Szerling, Anna ; Kosiel, Kamil...
Materials Science in Semiconductor Processing.  74 (2018)  - p. 88-97 , 2018
Link: https://doi.org/10.1016/..
 
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7

Communication—Direct Imaging of Irradiation Damage in Semic..:

Jóźwik, Iwona ; Dąbrowska, Elżbieta ; Maląg, Andrzej.
ECS Journal of Solid State Science and Technology.  6 (2017)  7 - p. P415-P417 , 2017
Link: https://doi.org/10.1149/..
 
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8

Ion implantation for isolation of AlGaN/GaN HEMTs using C o..:

Taube, Andrzej ; Kamińska, Eliana ; Kozubal, Maciej...
physica status solidi (a).  212 (2015)  5 - p. 1162-1169 , 2015
Link: https://doi.org/10.1002/..
 
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9

Optimization of H+ Implantation Parameters for Exfoliation ..:

Amarasinghe, Voshadhi P. ; Wielunski, Leszek ; Barcz, Adam..
ECS Transactions.  50 (2013)  7 - p. 341-348 , 2013
Link: https://doi.org/10.1149/..
 
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10

Structure of self-implanted silicon annealed under enhanced..:

Misiuk, Andrzej ; Bak-Misiuk, Jadwiga ; Barcz, Adam...
High Pressure Research.  31 (2011)  1 - p. 102-105 , 2011
Link: https://doi.org/10.1080/..
 
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11

Silicon Dioxide as a Boundary for Oxygen Outdiffusion from ..:

Barcz, Adam
Defect and Diffusion Forum.  297-301 (2010)  - p. 688-693 , 2010
Link: https://doi.org/10.4028/..
 
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12

Structural and magnetic properties of the molecular beam ep..:

Lawniczak-Jablonska, Krystyna ; Wolska, Anna ; Bak-Misiuk, Jadwiga...
Journal of Applied Physics.  106 (2009)  8 - p. , 2009
Link: https://doi.org/10.1063/..
 
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13

The role of fluorine-containing ultra-thin layer in control..:

Kalisz, Małgorzata ; B. Beck, Romuald ; Barcz, Adam.
Journal of Telecommunications and Information Technology.  , 2007
Link: https://doi.org/10.26636..
 
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14

Growth and structural properties of thick GaN layers obtain..:

Kaminski, Michal ; Podsiadlo, Slawomir ; Wozniak, Krzysztof...
Journal of Crystal Growth.  303 (2007)  2 - p. 395-399 , 2007
Link: https://doi.org/10.1016/..
 
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15

New Chemical Method of Obtaining Thick Ga1-xMnxN Layers:  P..:

Kaminski, Michal ; Podsiadlo, Slawomir ; Dominik, Pawel...
Chemistry of Materials.  19 (2007)  13 - p. 3139-3143 , 2007
Link: https://doi.org/10.1021/..
 
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