E-LIB Suche - Ergebnisse für: Barnaby, Hugh J.

1

Radiation-Induced Charge Trapping in Shallow Trench Isolati..:

Bonaldo, Stefano ; Wallace, Trace ; Barnaby, Hugh...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 427-436 , 2024

Link: https://doi.org/10.1109/..

2

Neutron Displacement Damage in Bipolar Junction Transistors..:

Young, Joshua M. ; Banerjee, Sneha ; Ho, Le Thanh Triet...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 569-578 , 2024

Link: https://doi.org/10.1109/..

3

The Effects of Threshold Voltage and Number of Fins Per Tra..:

Vidana, Aldo I. ; Dodds, Nathaniel A. ; Nowlin, R. Nathan...
IEEE Transactions on Nuclear Science. 71 (2024) 4 - p. 477-484 , 2024

Link: https://doi.org/10.1109/..

4

Evidence of Transport Degradation in 22 nm FD-SOI Charge Tr..:

Al Mamun, Fahad ; Vrudhula, Sarma ; Vasileska, Dragica..
Solid-State Electronics. 209 (2023) - p. 108783 , 2023

Link: https://doi.org/10.1016/..

5

TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFE..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Neuendank, Jereme ; Al Mamun, Fahad ; Barnaby, Hugh... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

6

Non-Linear Coupling Effects in Fully Depleted SOI Transisto..:

Spear, Matthew ; Barnaby, Hugh J. ; Wallace, Trace...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 434-441 , 2023

Link: https://doi.org/10.1109/..

7

Single-Event Effects Induced by Heavy Ions in SONOS Charge ..:

Xiao, T. Patrick ; Bennett, Christopher H. ; Agarwal, Sapan...
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 406-413 , 2022

Link: https://doi.org/10.1109/..

8

Single Event Upset and Total Ionizing Dose Response of 12LP..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),

Neuendank, Jereme ; Spear, Matthew ; Wallace, Trace... - p. 1-9 , 2022

Link: https://doi.org/10.1109/..

9

Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),

Solano, Jose ; Spear, Matthew ; Wallace, Trace... - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

10

TCAD Calibrated SEE Fault Model Validated with Beam Results..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

YoungSciortino, Clifford ; Neuendank, Jereme ; Clark, Lawrence T.... - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

11

Radiation Hardened Millimeter-Wave Receiver Implemented in ..:

Al Seragi, Ebrahim M. ; Dash, Subhra ; Muthuseenu, K....
IEEE Transactions on Nuclear Science. 69 (2022) 10 - p. 2154-2161 , 2022

Link: https://doi.org/10.1109/..

12

An implicit analytical surface potential based model for lo..:

Livingston, Ian P. ; Esqueda, Ivan S. ; Barnaby, Hugh J.
Solid-State Electronics. 187 (2022) - p. 108193 , 2022

Link: https://doi.org/10.1016/..

13

Self-correcting Flip-flops for Triple Modular Redundant Log..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),

Clark, Lawrence T. ; Duvnjak, Alen ; Young-Sciortino, Clifford... - p. 1205-1209 , 2022

Link: https://doi.org/10.1109/..

14

A Soft-Error Hardened by Design Microprocessor Implemented ..:

Clark, Lawrence T. ; Duvnjak, Alen ; Cannon, Matthew...
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1602-1609 , 2022

Link: https://doi.org/10.1109/..

15

Effect of conductance linearity of Ag-chalcogenide CBRAM sy..:

Apsangi, Priyanka ; Barnaby, Hugh ; Kozicki, Michael..
Neuromorphic Computing and Engineering. 2 (2022) 2 - p. 021002 , 2022

Link: https://doi.org/10.1088/..