Bashar, Erfan
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3

Unipolar and Bipolar Pulsed Gate Stresses and Threshold Vol..:

, In: 2022 IEEE Energy Conversion Congress and Exposition (ECCE),
 
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4

On the Repeatability and Reliability of Threshold Voltage M..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
 
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5

Analysis of DC offset in fault current caused by machines i..:

Bashar, Erfan ; Han, Qin ; Wu, Ruizhu...
The Journal of Engineering.  2019 (2019)  17 - p. 3494-3499 , 2019
 
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6

A Method to Contain the Temperature Rise of a Press-Pack Th..:

, In: 2019 IEEE Energy Conversion Congress and Exposition (ECCE),
Bashar, Erfan ; Rogers, Dan ; Wu, Ruizhu... - p. 3311-3317 , 2019
 
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8

A Review of Power Electronic Devices for Heavy Goods Vehicl..:

Alatise, Olayiwola ; Deb, Arkadeep ; Bashar, Erfan...
Alatise , O , Deb , A , Bashar , E , Gonzalez , J O , Jahdi , S & Issa , W 2023 , ' A Review of Power Electronic Devices for Heavy Goods Vehicles Electrification: Performance and Reliability ' , Energies , vol. 16 , no. 11 , 4380 . https://doi.org/10.3390/en16114380.  , 2023
 
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9

Investigation of the Static Performance and Avalanche Relia..:

Shen, Chengjun ; Jahdi, Saeed ; Mellor, Phil H...
Shen , C , Jahdi , S , Mellor , P H , Yang , J , Bashar , E , Ortiz-Gonzalez , J & Alatise , O 2022 , Investigation of the Static Performance and Avalanche Reliability of High Voltage 4H-SiC Merged-PiN-Schottky Diodes . in 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) . Institute of Electrical and Electronics Engineers (IEEE) , Hanover, Germany , 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) , Hanover , Germany , 5/09/22 ..  , 2022
 
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10

Unipolar and Bipolar Pulsed Gate Stresses and Threshold Vol..:

Deb, Arkadeep ; Gonzalez, Jose Ortiz ; Bashar, Erfan...
Deb , A , Gonzalez , J O , Bashar , E , Jahdi , S , Taha , M & Taodizadeh , M 2022 , Unipolar and Bipolar Pulsed Gate Stresses and Threshold Voltage Shifts in GaN e-HEMTs . in 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 . 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 , Institute of Electrical and Electronics Engineers (IEEE) , Detroit, MI, USA , 2022 IEEE Energy Conversion Congress and Exposition (ECCE) , 9/10/22 . https://doi.org/10.1109/ECCE50734.2022.9947415.  , 2022
 
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11

Analysis of on-state static and dynamic transients of high ..:

Shen, Chengjun ; Jahdi, Saeed ; Mellor, Phil H...
Shen , C , Jahdi , S , Mellor , P H , Yang , J , Bashar , E , Alatise , O & Ortiz-Gonzalez , J 2022 , Analysis of on-state static and dynamic transients of high voltage 4H-SiC Merged-PiN-Schottky diode . in 11th International Conference on Power Electronics, Machines and Drives (PEMD 2022) . Institution of Engineering and Technology (IET) , pp. 314-320 , 11th International Conference on Power Electronics, Machines and Drives (PEMD 2022) , Newcastle , United Kingdom , 21/06/22 . https://doi.org/10.1049/icp.2022.1068.  , 2022
 
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12

A Review of Short Circuit Performance in 650 V Power Device..:

Bashar, Erfan ; Agbo, Nereus ; Wu, Ruizhu...
Bashar , E , Agbo , N , Wu , R , Mendy , S , Jahdi , S , Jennings , M , Withey , A , Evans , S , Davies , G , Demitrova , J , Gonzalez , J O & Alatise , O 2022 , A Review of Short Circuit Performance in 650 V Power Devices : SiC MOSFETs, Silicon Super-junction MOSFETs, SiC Cascode JFETs, Silicon MOSFETs and Silicon IGBTs . in PCIM Europe 2022 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management . PCIM Europe Conference Proceedings , VDE Verlag , pp. 1167-1174 , International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2022 , Nuremberg , Germany , 10/05/22 . https://doi.org/10.30420/565822162.  , 2022
 
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13

Transfer IV and Threshold Voltage Drift of GaN and SiC Casc..:

Gunaydin, Yasin ; Jahdi, Saeed ; Yuan, Xibo...
Gunaydin , Y , Jahdi , S , Yuan , X , Stark , B , Ortiz-Gonzalez , J , Bashar , E , Alatise , O & Mellor , P 2022 , Transfer IV and Threshold Voltage Drift of GaN and SiC Cascode Discrete Devices Under Gate Bias Stress . in PCIM Europe 2022 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management . PCIM Europe Conference Proceedings , VDE Verlag , pp. 263-268 , International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2022 , Nuremberg , Germany , 10/05/22 . https://doi.org/10.30420/565822039.  , 2022
 
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On the Repeatability and Reliability of Threshold Voltage M..:

Deb, Arkadeep ; Gonzalez, Jose Ortiz ; Bashar, Erfan...
Deb , A , Gonzalez , J O , Bashar , E , Jahdi , S , Taha , M , Mawby , P & Alatise , O 2022 , On the Repeatability and Reliability of Threshold Voltage Measurements during Gate Bias Stresses in Wide Bandgap Power Devices . in 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe) . Institute of Electrical and Electronics Engineers (IEEE) , Coventry, United Kingdom , 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe) , 18/09/22 . https://doi.org/10.1109/WiPDAEurope55971.2022.9936437.  , 2022
 
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