Bayraktaroglu, I.
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1

Seamless test of digital components in mixed-signal paths:

Ozev, S. ; Bayraktaroglu, I. ; Orailoglu, A.
IEEE Design & Test of Computers.  21 (2004)  1 - p. 44-55 , 2004
 
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2

Test application time and volume compression through seed o..:

, In: Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451),
Rao, W. ; Bayraktaroglu, I. ; Orailoglu, A. - p. 732,733,734,735,736,737 , 2003
 
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3

Gate Level Fault Diagnosis in Scan-Based BIST:

, In: Proceedings of the conference on Design, automation and test in Europe,
Bayraktaroglu, I. ; Orailoglu, A. - p. 376 ff. , 2002
 
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4

Cost-effective deterministic partitioning for rapid diagnos..:

Bayraktaroglu, I. ; Orailoglu, A.
IEEE Design & Test of Computers.  19 (2002)  1 - p. 42-53 , 2002
 
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5

Diagnosis for scan-based BIST : reaching deep into the s..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Bayraktaroglu, I. ; Orailoglu, A. - p. 102-111 , 2001
 
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6

Test volume and application time reduction through scan cha..:

, In: Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232),
Bayraktaroglu, I. ; Orailoglu, A. - p. 151,152,153,154,155 , 2001
 
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12

Thermally stable AlGaAs/GaAs microwave power HBT's:

Bayraktaroglu, B. ; Barrette, J. ; Fitch, R....
IEEE Transactions on Electron Devices.  40 (1993)  11 - p. 2112-2113 , 1993
 
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13

Modeling the avalanche multiplication current of AlGaAs/GaA..:

Liou, J.J. ; Liou, L.L. ; Huang, C.I..
Solid-State Electronics.  36 (1993)  8 - p. 1217-1221 , 1993
 
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