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Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) ,
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Test application time and volume compression through seed o..:
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Proceedings of the conference on Design, automation and test in Europe ,
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Gate Level Fault Diagnosis in Scan-Based BIST:
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Proceedings of the conference on Design, automation and test in Europe ,
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Diagnosis for scan-based BIST : reaching deep into the s..:
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Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232) ,
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