E-LIB Suche - Ergebnisse für: Beckers, Arthur

1

Side-channel Analysis of Lattice-based Post-quantum Cryptog..:

Mujdei, Catinca ; Wouters, Lennert ; Karmakar, Angshuman...
ACM Transactions on Embedded Computing Systems. 23 (2024) 2 - p. 1-23 , 2024

Link: https://doi.org/10.1145/..

2

Fault Attack Investigation on TaOx Resistive-RAM for Cyber ..:

Kumar, Ankit ; Degraeve, Robin ; Beckers, Arthur...
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4170-4177 , 2023

Link: https://doi.org/10.1109/..

3

(Adversarial) Electromagnetic Disturbance in the Industry:

Beckers, Arthur ; Guilley, Sylvain ; Maurine, Philippe..
IEEE Transactions on Computers. 72 (2023) 2 - p. 414-422 , 2023

Link: https://doi.org/10.1109/..

4

Provable Secure Software Masking in the Real-World:

, In: Constructive Side-Channel Analysis and Secure Design; Lecture Notes in Computer Science,

Beckers, Arthur ; Wouters, Lennert ; Gierlichs, Benedikt.. - p. 215-235 , 2022

Link: https://doi.org/10.1007/..

5

Energy and side-channel security evaluation of near-thresho..:

, In: Proceedings of the 19th ACM International Conference on Computing Frontiers,

Beckers, Arthur ; Uytterhoeven, Roel ; Vandenabeele, Thomas... - p. 258-262 , 2022

Link: https://dl.acm.org/doi/1..

6

Semi-Automatic Locating of Cryptographic Operations in Side..:

Trautmann, Jens ; Beckers, Arthur ; Wouters, Lennert...
IACR Transactions on Cryptographic Hardware and Embedded Systems. , 2021

Link: https://doi.org/10.46586..

7

Design Considerations for EM Pulse Fault Injection:

, In: Smart Card Research and Advanced Applications; Lecture Notes in Computer Science,

Beckers, Arthur ; Kinugawa, Masahiro ; Hayashi, Yuichi... - p. 176-192 , 2020

Link: https://doi.org/10.1007/..

8

Design and Evaluation of a Spark Gap Based EM-fault Injecti..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),

Beckers, Arthur ; Kinugawa, Masahiro ; Hayashi, Yuichi.. - p. 523-526 , 2020

Link: https://doi.org/10.1109/..

9

An In-Depth and Black-Box Characterization of the Effects o..:

, In: Smart Card Research and Advanced Applications; Lecture Notes in Computer Science,

Kumar, Dilip S. V. ; Beckers, Arthur ; Balasch, Josep.. - p. 156-170 , 2019

Link: https://doi.org/10.1007/..

10

Characterization of EM faults on ATmega328p:

, In: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC),

Beckers, Arthur ; Balasch, Josep ; Gierlichs, Benedikt... - p. 1-4 , 2019

Link: https://doi.org/10.23919..

11

25‐2: Enabling MOCVD Technology for Micro LED High Volume M..:

Boyd, Adam R. ; Beckers, Arthur ; Eickelkamp, Martin..
SID Symposium Digest of Technical Papers. 50 (2019) 1 - p. 342-345 , 2019

Link: https://doi.org/10.1002/..

12

45‐3: Invited Paper: Enabling the Next Era of Display Techn..:

Beckers, Arthur ; Fahle, Dirk ; Mauder, Christof...
SID Symposium Digest of Technical Papers. 49 (2018) 1 - p. 601-603 , 2018

Link: https://doi.org/10.1002/..

13

Fundamental study on non-invasive frequency injection attac..:

, In: 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC),

Osuka, Saki ; Fujimoto, Daisuke ; Hayashi, Yu-ichi... - p. 8-8 , 2018

Link: https://doi.org/10.1109/..

14

(Adversarial) Electromagnetic Disturbance in the Industry:

Beckers, Arthur ; Guilley, Sylvain ; Maurine, Philippe..
info:eu-repo/semantics/altIdentifier/doi/10.1109/TC.2022.3224373. , 2023

Link: https://telecom-paris.ha..

15

(Adversarial) Electromagnetic Disturbance in the Industry:

Beckers, Arthur ; Guilley, Sylvain ; Maurine, Philippe..
info:eu-repo/semantics/altIdentifier/doi/10.1109/TC.2022.3224373. , 2023

Link: https://telecom-paris.ha..