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2023 IEEE International Reliability Physics Symposium (IRPS) ,
3
Reliability assessment of hafnia-based ferroelectric device..:
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2021 IEEE International Memory Workshop (IMW) ,
4
16kbit 1T1R OxRAM arrays embedded in 28nm FDSOI technology ..:
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2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC) ,
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