Bekaert, L.
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Three-Layer BEOL Process Integration with Supervia and Self..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Vega-Gonzalez, V. ; Bekaert, J. ; Kesters, E.... - p. 19.3.1-19.3.4 , 2019
 
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Structural and electronic properties of defects at grain bo..:

Saniz, R. ; Bekaert, J. ; Partoens, B..
Physical Chemistry Chemical Physics.  19 (2017)  22 - p. 14770-14780 , 2017
 
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