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Beltrando, Bastien
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1

Low-PBTS defect-engineered high-mobility metal-oxide BEOL t..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Beltrando, Bastien ; Coppolelli, Bruno ; Kim, Jung-Bae... - p. 4A.2-1-4A.2-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

A Study on High Performance, Dual-Gate a-IZO/a-IGZTO TFTs w..:

Nahar, Sabiqun ; Priyadarshi, Sunaina ; Billah, Mohammad Masum...
IEEE Electron Device Letters.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Insights into device and material origins and physical mech..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Rollo, Tommaso... - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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4

Electron-assisted switching in FeFETs: Memory window dynami..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Padovani, Andrea... - p. 4A.1-1-4A.1-8 , 2022
Link: https://doi.org/10.1109/..
 
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5

Variability sources and reliability of 3D — FeFETs:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Padovani, Andrea... - p. 1-7 , 2021
Link: https://doi.org/10.1109/..
 
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6

Embedding ferroelectric HfOx in memory hierarchy: Material-..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Pesic, Milan ; Beltrando, Bastien - p. 33.4.1-33.4.4 , 2021
Link: https://doi.org/10.1109/..
 
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7

Investigation of $I-V$ Linearity in TaO x -Based RRAM Devic..:

Changhyuck Sung ; Andrea Padovani ; Bastien Beltrando...
https://ieeexplore.ieee.org/document/8658233/.  , 2019
Link: https://doi.org/10.1109/..
 
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