Search for persons
X
?
2023 IEEE European Test Symposium (ETS) ,
1
Counterfeit Detection by Semiconductor Process Technology I..:
, In:
?
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
2
No-Reference Image Quality Assessment for Reverse Engineeri..:
, In:
?
2022 30th European Signal Processing Conference (EUSIPCO) ,
3
Boundary Enhanced Semantic Segmentation for High Resolution..:
, In:
?
Artificial Intelligence for Digitising Industry – Applications ,
4
Towards Fully Automated Verification of Semiconductor Techn..:
, In:
?
2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) ,
5
Automated Defect Inspection in Reverse Engineering of Integ..:
, In:
?
8
The room at the end of the hall: an Ombudsman's notebook
Transgressions, Cultural studies and education, v. 92