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Bhuva, B.
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1

Single-Event Performance of Flip Flop Designs at the 5-nm B..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kronenberg, J. ; Xiong, Y. ; Pieper, N... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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2

Total-Ionizing Dose Damage from X-Ray PCB Inspection System:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N.J. ; Chun, M. ; Xiong, Y.... - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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3

Scaling Trends and Bias Dependence of SRAM SER from 16-nm t..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Narasimham, B. ; Montoya, A. R. ; Paone, C.... - p. 10C.2-1-10C.2-4 , 2024
Link: https://doi.org/10.1109/..
 
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4

Single-Event Upsets for Single-Port and Two-Port SRAM Cells..:

Pieper, N. J. ; Xiong, Y. ; Pasternak, J....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1673-1679 , 2023
Link: https://doi.org/10.1109/..
 
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5

Effects of Collected Charge and Drain Area on SE Response o..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N.J. ; Xiong, Y. ; Ball, D.R... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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6

Fault Propagation in Microprocessors with Configurable Cach..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Esquer, S. ; Shani, B. ; Witulski, A. F.... - p. 1-8 , 2022
Link: https://doi.org/10.1109/..
 
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7

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Xiong, Y. ; Feeley, A. ; Pieper, N. J.... - p. 7C.3-1-7C.3-7 , 2022
Link: https://doi.org/10.1109/..
 
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8

SE Performance of D-FF Designs With Different VT Options at..:

Feeley, A. ; Xiong, Y. ; Pieper, N. J...
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1582-1586 , 2022
Link: https://doi.org/10.1109/..
 
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9

Single-Event Latchup Vulnerability at the 7-nm FinFET Node:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N. J. ; Xiong, Y. ; Feeley, A... - p. 5C.2-1-5C.2-6 , 2022
Link: https://doi.org/10.1109/..
 
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10

Frequency, LET, and Supply Voltage Dependence of Logic Soft..:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Xiong, Y. ; Feeley, A. ; Massengill, L.W.... - p. 1-5 , 2021
Link: https://doi.org/10.1109/..
 
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11

Micro-Latchup Location and Temperature Characterization in ..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Pieper, N. J. ; Xiong, Y. ; Feeley, A.... - p. 1-7 , 2021
Link: https://doi.org/10.1109/..
 
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12

The restoration of root filled teeth: a review of the clini..:

Bhuva, B. ; Giovarruscio, M. ; Rahim, N...
International Endodontic Journal.  54 (2021)  4 - p. 509-535 , 2021
Link: https://doi.org/10.1111/..
 
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13

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Nod:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Xu, L. ; Cao, J. ; Brockman, J.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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14

Temperature Dependence of Single-Event Transient Pulse Widt..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Cao, J. ; Xu, L. ; Wen, S.-J.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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15

High-Current State triggered by Operating-Frequency Change:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Xu, L. ; Cao, J. ; Wen, S.-J.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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