Bickford, Jeanne P.
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Editorial:

Bickford, Jeanne P. ; Djurdjanovic, Dragan ; Natarajan, Mahadeva Iyer
IEEE Transactions on Semiconductor Manufacturing.  37 (2024)  1 - p. 2-2 , 2024
 
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Terminal metal inspection yield improvement YE: Yield enhan..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Bickford, Jeanne P. - p. 222-225 , 2017
 
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Method and structure to reduce leakage for ESD device: ET/I..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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Guest Editorial Special Section on the 2022 SEMI Advanced S..:

Bickford, Jeanne Paulette ; Patterson, Oliver D. ; Le Cunff, Delphine...
IEEE Transactions on Semiconductor Manufacturing.  36 (2023)  3 - p. 307-310 , 2023
 
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