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1

A Generic Trap Generation Framework for MOSFET Reliability—..:

Mahapatra, Souvik ; Ansari, Aseer ; Bisht, Arnav Shaurya...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 114-125 , 2024

Link: https://doi.org/10.1109/..

2

Impact of Gate Insulator Process on NBTI in FinFETs and Res..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Bisht, Arnav Shaurya ; Chatterjee, Payel ; Mahapatra, Souvik - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

3

A Device to Circuit Framework for NBTI:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Chatterjee, Payel ; Thakor, Karansingh ; Bisht, Arnav Shaurya... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

4

Role of Quantum Computing and Metaverse in the Field of Hea..:

, In: 2023 5th International Conference on Inventive Research in Computing Applications (ICIRCA),

Bajkoti, Adarsh Singh ; Tiwari, Shaurya ; Ranjan, Tanishq.. - p. 306-311 , 2023

Link: https://doi.org/10.1109/..

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