Bisti, F.
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1

A simple laser beam characterization apparatus based on ima..:

Schmidt, M. ; Lanzetta, M. ; Alexeev, I..
Journal of Applied Research and Technology.  19 (2021)  2 - p. 98-116 , 2021
 
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Band structure of the EuO/Si interface: justification for s..:

Lev, L. L. ; Averyanov, D. V. ; Tokmachev, A. M....
Journal of Materials Chemistry C.  5 (2017)  1 - p. 192-200 , 2017
 
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14

Response to NO2 and other gases of resistive chemically exf..:

Donarelli, M. ; Prezioso, S. ; Perrozzi, F....
Sensors and Actuators B: Chemical.  207 (2015)  - p. 602-613 , 2015
 
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