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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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Backtracking Search for Optimal Parameters of a PLL-based T..:
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
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Backtracking search for optimal parameters of a PLL-based t..:
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2017 IEEE 2nd International Verification and Security Workshop (IVSW) ,
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