Bogart, L. K.
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2

Effect of low contrast medium-dose CTA on device sizing and..:

Suchá, D. ; Kino, A. ; Bogart, K....
European Journal of Radiology.  124 (2020)  - p. 108826 , 2020
 
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10

Correlation of topography measurements of NIST SRM 2460 sta..:

Song, J ; Vorburger, T ; Renegar, T...
Measurement Science and Technology.  17 (2006)  3 - p. 500-503 , 2006
 
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12

Thermal stability of thin InGaN films on GaN:

Thaler, G.T. ; Koleske, D.D. ; Lee, S.R...
Journal of Crystal Growth.  312 (2010)  11 - p. 1817-1822 , 2010
 
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13

Deep level optical spectroscopy of GaN nanorods:

Armstrong, A. ; Li, Q. ; Bogart, K. H. A....
Journal of Applied Physics.  106 (2009)  5 - p. , 2009
 
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14

Smooth and Vertical Facet Formation for AlGaN-Based Deep-UV..:

Miller, M.A. ; Crawford, M.H. ; Allerman, A.A....
Journal of Electronic Materials.  38 (2009)  4 - p. 533-537 , 2009
 
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