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Bonar, J.M.
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1

WCN23-0253 CHARACTERISTICS OF MAINTENANCE HEMODIALYSIS PATI..:

JAUWERISSA, R. ; Bonar, M. ; Nugroho, P..
Kidney International Reports.  8 (2023)  3 - p. S285-S286 , 2023
Link: https://doi.org/10.1016/..
 
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2

Observation of a p < 10–9 life-history event: implications ..:

Bonar, M. ; Laforge, M.P. ; Vander Wal, E.
Canadian Journal of Zoology.  95 (2017)  2 - p. 133-137 , 2017
Link: https://doi.org/10.1139/..
 
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3

Systematic review of the development, implementation and av..:

Gray, L. J. ; Leigh, T. ; Davies, M. J....
Diabetic Medicine.  30 (2013)  6 - p. 758-760 , 2013
Link: https://doi.org/10.1111/..
 
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4

Suppression of boron diffusion due to carbon during rapid t..:

Karunaratne, M. S. A. ; Bonar, J. M. ; Ashburn, P..
Journal of Materials Science.  41 (2006)  3 - p. 1013-1016 , 2006
Link: https://doi.org/10.1007/..
 
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5

Effect of fluorine on boron diffusion under interstitial in..:

Kham, M.N. ; El Mubarek, H.A.W. ; Bonar, J.M...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  253 (2006)  1-2 - p. 100-104 , 2006
Link: https://doi.org/10.1016/..
 
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6

Suppression of boron transient enhanced diffusion in silico..:

El Mubarek, H.A.W. ; Wang, Y. ; Price, R....
Materials Science in Semiconductor Processing.  8 (2005)  1-3 - p. 103-109 , 2005
Link: https://doi.org/10.1016/..
 
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7

Effect of fluorine on boron thermal diffusion in the presen..:

Kham, M.N. ; El Mubarek, H.A.W. ; Bonar, J.M..
Materials Science and Engineering: B.  124-125 (2005)  - p. 192-195 , 2005
Link: https://doi.org/10.1016/..
 
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8

Effect of point defect injection on diffusion of boron in s..:

Karunaratne, M. S. A. ; Willoughby, A. F. W. ; Bonar, J. M...
Journal of Applied Physics.  97 (2005)  11 - p. , 2005
Link: https://doi.org/10.1063/..
 
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9

Study of fluorine behavior in silicon by selective point de..:

Kham, M. N. ; El Mubarek, H. A. W. ; Bonar, J. M..
Applied Physics Letters.  87 (2005)  1 - p. , 2005
Link: https://doi.org/10.1063/..
 
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10

Arsenic diffusion in Si and strained SixGe1−x alloys at 100..:

Uppal, Suresh ; Bonar, J.M. ; Zhang, Jing.
Materials Science and Engineering: B.  114-115 (2004)  - p. 349-351 , 2004
Link: https://doi.org/10.1016/..
 
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11

Effect of fluorine implantation dose on boron thermal diffu..:

El Mubarek, H. A. W. ; Bonar, J. M ; Dilliway, G. D....
Journal of Applied Physics.  96 (2004)  8 - p. 4114-4121 , 2004
Link: https://doi.org/10.1063/..
 
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12

Comparison of arsenic diffusion in Si1−xGex formed by epita..:

Mitchell, M. J. ; Ashburn, P. ; Bonar, J. M..
Journal of Applied Physics.  93 (2003)  8 - p. 4526-4528 , 2003
Link: https://doi.org/10.1063/..
 
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13

Low-pressure chemical vapour deposition growth of epitaxial..:

Lloyd, N.S ; Bonar, J.M
Materials Science and Engineering: B.  89 (2002)  1-3 - p. 310-313 , 2002
Link: https://doi.org/10.1016/..
 
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14

Characterisation of emitter/base leakage currents in SiGe H..:

Lamb, A.C ; Schiz, J.F.W ; Bonar, J.M...
Microelectronics Reliability.  41 (2001)  2 - p. 273-279 , 2001
Link: https://doi.org/10.1016/..
 
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15

On the use of total reflection x-ray topography for the obs..:

McNally, Patrick J. ; Dilliway, G. ; Bonar, J. M....
Applied Physics Letters.  77 (2000)  11 - p. 1644-1646 , 2000
Link: https://doi.org/10.1063/..
 
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