I agree that this site is using cookies. You can find further informations here.
X
Borghello, Giulio
14  results:
Search for persons X
?
1

Radiation-Induced Charge Trapping in Shallow Trench Isolati..:

Bonaldo, Stefano ; Wallace, Trace ; Barnaby, Hugh...
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 427-436 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Characteristics and ultra-high total ionizing dose response..:

Termo, Gennaro ; Borghello, Giulio ; Faccio, Federico...
Journal of Instrumentation.  19 (2024)  3 - p. C03039 , 2024
Link: https://doi.org/10.1088/..
 
?
3

Generic Analog 8 Bit DAC IP Block in 28nm CMOS for the High..:

, In: 2022 Austrochip Workshop on Microelectronics (Austrochip),
Piller, Markus ; Ballabriga, Rafael ; Bandi, Franco Nahuel... - p. 5-8 , 2022
Link: https://doi.org/10.1109/..
 
?
4

A generalized EKV charge-based MOSFET model including oxide..:

Zhang, Chun-Min ; Jazaeri, Farzan ; Borghello, Giulio...
Solid-State Electronics.  177 (2021)  - p. 107951 , 2021
Link: https://doi.org/10.1016/..
 
?
5

Modeling of High Total Ionizing Dose (TID) Effects for Encl..:

, In: 2018 International Semiconductor Conference (CAS),
Nikolaou, Aristeidis ; Bucher, Matthias ; Makris, Nikolaos... - p. 133-136 , 2018
Link: https://doi.org/10.1109/..
 
?
6

TA04-65: EXP28 - Single Event Effect (EXP28-SEE):

Borghello, Giulio
info:eu-repo/grantAgreement/EC/H2020/101008126/.  , 2023
Link: https://zenodo.org/recor..
 
?
7

Optimization of a 65 nm CMOS imaging process for monolithic..:

Snoeys, Walter ; Aglieri Rinella, Gianluca ; Andronic, Anton...
Pos proceedings of science.  , 2023
Link: https://publikationen.bi..
 
?
8

TA05-101: EXP28 - Proton Test (EXP28-PT):

Borghello, Giulio
info:eu-repo/grantAgreement/EC/H2020/101008126/.  , 2023
Link: https://zenodo.org/recor..
 
?
9

Forward and reverse operation of enclosed-gate MOSFETs and ..:

Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou) ; Χεβας Λουκας(http://users.isc.tuc.gr/~lchevas)...
info:eu-repo/grantAgreement/EC/FP7/246686.  , 2020
Link: http://purl.tuc.gr/dl/di..
 
?
10

Ionizing radiation effects in nanoscale CMOS technologies e..:

BORGHELLO, GIULIO
http://hdl.handle.net/11390/1146985.  , 2019
Link: http://hdl.handle.net/11..
 
?
11

Total ionizing dose effects on analog performance of 65 nm ..:

Bucher Matthias(http://users.isc.tuc.gr/~mbucher) ; Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou)...
info:eu-repo/grantAgreement/EC/FP7/246686.  , 2019
Link: http://purl.tuc.gr/dl/di..
 
?
12

Investigation of scaling and temperature effects in total i..:

Χεβας Λουκας(http://users.isc.tuc.gr/~lchevas) ; Chevas Loukas(http://users.isc.tuc.gr/~lchevas) ; Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou)...
info:eu-repo/grantAgreement/EC/FP7/246686.  , 2019
Link: http://purl.tuc.gr/dl/di..
 
?
13

Extending a 65nm CMOS process design kit for high total ion..:

Νικολαου Αριστειδης(http://users.isc.tuc.gr/~Anikolaou) ; Nikolaou Aristeidis(http://users.isc.tuc.gr/~Anikolaou) ; Bucher Matthias(http://users.isc.tuc.gr/~mbucher)...
info:eu-repo/grantAgreement/EC/FP7/246686.  , 2019
Link: http://purl.tuc.gr/dl/di..
 
?
14

FCC physics opportunities : Future Circular Collider Concep..:

Abada, Asmaa ; Abbrescia, Marcello ; AbdusSalam, Shehu S...
Abada, A., Abbrescia, M., AbdusSalam, S. S., Abdyukhanov, I., Fernandez, J. A., Abramov, A., . . . The FCCCollaboration. (2019). FCC physics opportunities: Future circular collider conceptual design report volume 1. European Physical Journal C, 79(6) doi:10.1140/epjc/s10052-019-6904-3.  , 2019
Link: https://www.um.edu.mt/li..
 
1-14