Boschker, Hans
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4

Atomic-scale imaging of flexoelectric polarization around e..:

Wang, Hongguang ; Boschker, Hans ; Jiang, Xijie...
Microscopy and Microanalysis.  27 (2021)  S1 - p. 2332-2333 , 2021
 
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Aberration-corrected STEM Observations on the Interfacial S..:

Wang, H ; Srot, V ; Laskin, G...
Microscopy and Microanalysis.  25 (2019)  S2 - p. 964-965 , 2019
 
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15

Threshold-Voltage Shifts in Organic Transistors Due to Self..:

Aghamohammadi, Mahdieh ; Rödel, Reinhold ; Zschieschang, Ute...
ACS Applied Materials & Interfaces.  7 (2015)  41 - p. 22775-22785 , 2015
 
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