E-LIB Suche - Ergebnisse für: Bosman, Dries

1

Fokas Based Dirichlet-to-Neumann Operators for Accurate Sig..:

, In: 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO),

Huynen, Martijn ; Bosman, Dries ; De Zutter, Daniel. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

2

Reduced-Order Stochastic Testing of Interconnects Subject t..:

, In: 2023 IEEE 27th Workshop on Signal and Power Integrity (SPI),

Huynen, Martijn ; Waeytens, Ruben ; Bosman, Dries... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

3

Analysis and Application of a Surface Admittance Operator f..:

Bosman, Dries ; Huynen, Martijn ; De Zutter, Daniël...
IEEE Transactions on Microwave Theory and Techniques. 71 (2023) 7 - p. 2794-2806 , 2023

Link: https://doi.org/10.1109/..

4

Efficient Characterization of Interconnects With Arbitrary ..:

Bosman, Dries ; Huynen, Martijn ; De Zutter, Daniël...
IEEE Transactions on Components, Packaging and Manufacturing Technology. 13 (2023) 10 - p. 1567-1575 , 2023

Link: https://doi.org/10.1109/..

5

Interconnect Modeling using a Surface Admittance Operator D..:

, In: 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS),

Bosman, Dries ; Huynen, Martijn ; De Zutter, Daniel... - p. 1-3 , 2022

Link: https://doi.org/10.1109/..

6

Construction of the differential surface admittance operato..:

Bosman, Dries ; Huynen, Martijn ; De Zutter, Daniël.
Computers & Mathematics with Applications. 128 (2022) - p. 44-54 , 2022

Link: https://doi.org/10.1016/..

7

Accurate Characterization of Radiation from Interconnects o..:

, In: 2022 IEEE 26th Workshop on Signal and Power Integrity (SPI),

Huynen, Martijn ; Bosman, Dries ; Moerman, Arno. - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

8

A 2-D differential surface admittance operator for combined..:

Bosman, Dries ; Huynen, Martijn ; De Zutter, Daniël..
Computers & Mathematics with Applications. 102 (2021) - p. 175-186 , 2021

Link: https://doi.org/10.1016/..

9

Analysis of the Influence of Roughness on the Propagation C..:

, In: 2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS),

Waeytens, Ruben ; Bosman, Dries ; Huynen, Martijn... - p. 1-3 , 2020

Link: https://doi.org/10.1109/..

10

IntAct: A nondisruptive internal tagging strategy to study ..:

van Zwam, Maxime C. ; Dhar, Anubhav ; Bosman, Willem...
PLOS Biology. 22 (2024) 3 - p. e3002551 , 2024

Link: https://doi.org/10.1371/..