Brücken, E.
2297  results:
Search for persons X
?
1

Analysis and characterization of CdTe material surface defe..:

Bezak, M. ; Bharthuar, S. ; Brücken, E....
Journal of Instrumentation.  18 (2023)  2 - p. C02004 , 2023
 
?
3

Correction of the baseline fluctuations in the GEM-based AL..:

Alme, J. ; Alt, T. ; Andrei, C....
Journal of Instrumentation.  18 (2023)  11 - p. P11021 , 2023
 
?
 
?
5

Characterisation of gamma-irradiated MCz-silicon detectors ..:

Bharthuar, S. ; Bezak, M. ; Brücken, E....
Journal of Instrumentation.  17 (2022)  12 - p. C12002 , 2022
 
?
 
?
8

Multispectral photon-counting for medical imaging and beam ..:

Kirschenmann, S. ; Bezak, M. ; Bharthuar, S....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1039 (2022)  - p. 167043 , 2022
 
?
10

AC-coupled n-in-p pixel detectors on MCz silicon with atomi..:

Gädda, A. ; Ott, J. ; Bharthuar, S....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  986 (2021)  - p. 164714 , 2021
 
?
 
?
13

Test beam characterization of sensor prototypes for the CMS..:

Abbott, R. ; Abreu, A. ; Addesa, F....
Journal of Instrumentation.  16 (2021)  7 - p. P07023 , 2021
 
?
14

Characterization of magnetic Czochralski silicon devices wi..:

Ott, J. ; Bharthuar, S. ; Gädda, A....
Journal of Instrumentation.  16 (2021)  5 - p. P05011 , 2021
 
?
15

Modeling the impact of defects on the charge collection eff..:

Golovleva, M. ; Bezak, M. ; Bharthuar, S....
Journal of Instrumentation.  16 (2021)  8 - p. P08027 , 2021
 
1-15