Bristol, J. R.
366  results:
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1

Gate length scaling beyond Si: Mono-layer 2D Channel FETs R..:

, In: 2022 International Electron Devices Meeting (IEDM),
Dorow, C. J. ; Penumatcha, A. ; Kitamura, A.... - p. 7.5.1-7.5.4 , 2022
 
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2

300 mm MOCVD 2D CMOS Materials for More (Than) Moore Scalin:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Maxey, K. ; Naylor, C. H. ; O'Brien, K. P.... - p. 419-420 , 2022
 
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3

FeRAM using Anti-ferroelectric Capacitors for High-speed an..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Chang, S. -C. ; Haratipour, N. ; Shivaraman, S.... - p. 33.2.1-33.2.4 , 2021
 
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4

Advancing 2D Monolayer CMOS Through Contact, Channel and In..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
O'Brien, K. P. ; Dorow, C. J. ; Penumatcha, A.... - p. 7.1.1-7.1.4 , 2021
 
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5

Opportunities in 3-D stacked CMOS transistors:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Radosavljevic, M. ; Huang, C.-Y. ; Rachmady, W.... - p. 34.1.1-34.1.4 , 2021
 
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7

3D heterogeneous integration of high performance high-K met..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Then, Han Wui ; Huang, C. Y. ; Krist, B.... - p. 17.3.1-17.3.4 , 2019
 
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8

Grazing incidence broad ion beams for reducing line-edge ro..:

Struck, C R M ; Flauta, R ; Neumann, M J...
Journal of Micromechanics and Microengineering.  20 (2010)  7 - p. 075038 , 2010
 
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10

Occurrence of faecal contamination in households along the ..:

Carrasco, L. ; Mena, K.D. ; Mota, L.C....
Letters in Applied Microbiology.  46 (2008)  6 - p. 682-687 , 2008
 
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11

On cooperative instabilities of parallel vortex pairs:

BRISTOL, R. L. ; ORTEGA, J. M. ; MARCUS, P. S..
Journal of Fluid Mechanics.  517 (2004)  - p. 331-358 , 2004
 
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