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Bubulac, L. O.
55
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1
Defects and the Formation of Impurity 'Hot Spots' in HgCdTe..:
Benson, J. D.
;
Bubulac, L. O.
;
Jacobs, R. N.
...
Journal of Electronic Materials. 48 (2019) 10 - p. 6194-6202 , 2019
Link:
https://doi.org/10.1007/..
?
2
Impurity 'Hot Spots' in MBE HgCdTe/CdZnTe:
Benson, J. D.
;
Bubulac, L. O.
;
Wang, A.
...
Journal of Electronic Materials. 47 (2018) 10 - p. 5671-5679 , 2018
Link:
https://doi.org/10.1007/..
?
3
Impact of CdZnTe Substrates on MBE HgCdTe Deposition:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 46 (2017) 9 - p. 5418-5423 , 2017
Link:
https://doi.org/10.1007/..
?
4
Analysis of Etched CdZnTe Substrates:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 45 (2016) 9 - p. 4502-4510 , 2016
Link:
https://doi.org/10.1007/..
?
5
As-Received CdZnTe Substrate Contamination:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 44 (2015) 9 - p. 3082-3091 , 2015
Link:
https://doi.org/10.1007/..
?
6
Impact of Tellurium Precipitates in CdZnTe Substrates on MB..:
Benson, J. D.
;
Bubulac, L. O.
;
Smith, P. J.
...
Journal of Electronic Materials. 43 (2014) 11 - p. 3993-3998 , 2014
Link:
https://doi.org/10.1007/..
?
7
Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrat..:
Benson, J. D.
;
Bubulac, L. O.
;
Lennon, C. M.
...
Journal of Electronic Materials. 42 (2013) 11 - p. 3217-3223 , 2013
Link:
https://doi.org/10.1007/..
?
8
Growth and Analysis of HgCdTe on Alternate Substrates:
Benson, J.D.
;
Bubulac, L.O.
;
Smith, P.J.
...
Journal of Electronic Materials. 41 (2012) 10 - p. 2971-2974 , 2012
Link:
https://doi.org/10.1007/..
?
9
The Distribution Tail of LWIR HgCdTe-on-Si FPAs: a Hypothet..:
Bubulac, L. O.
;
Benson, J.D.
;
Jacobs, R.N.
...
Journal of Electronic Materials. 40 (2011) 3 - p. 280-288 , 2011
Link:
https://doi.org/10.1007/..
?
10
Dislocation Analysis in (112)B HgCdTe/CdTe/Si:
Benson, J. D.
;
Farrell, S.
;
Brill, G.
...
Journal of Electronic Materials. 40 (2011) 8 - p. 1847-1853 , 2011
Link:
https://doi.org/10.1007/..
?
11
Microstructural Characterization of CdTe(211)B/ZnTe/Si(211)..:
ZHAO, W. F.
;
JACOBS, R. N.
;
JAIME-VASQUEZ, M.
..
Journal of Electronic Materials. 40 (2011) 8 - p. 1733-1737 , 2011
Link:
https://doi.org/10.1007/..
?
12
Evaluation of Surface Cleaning of Si(211) for Molecular-Bea..:
Jaime-Vasquez, M.
;
Jacobs, R. N.
;
Benson, J. D.
...
Journal of Electronic Materials. 39 (2010) 7 - p. 951-957 , 2010
Link:
https://doi.org/10.1007/..
?
13
Wafer Mapping Using Deuterium Enhanced Defect Characterizat..:
Hossain, K.
;
Holland, O.W.
;
Hellmer, R.
...
Journal of Electronic Materials. 39 (2010) 7 - p. 930-935 , 2010
Link:
https://doi.org/10.1007/..
?
14
Characterization of Dislocations in (112)B HgCdTe/CdTe/Si:
Benson, J. D.
;
Bubulac, L. O.
;
Smith, P. J.
...
Journal of Electronic Materials. 39 (2010) 7 - p. 1080-1086 , 2010
Link:
https://doi.org/10.1007/..
?
15
Topography and Dislocations in (112)B HgCdTe/CdTe/Si:
Benson, J. D.
;
Smith, P. J.
;
Jacobs, R. N.
...
Journal of Electronic Materials. 38 (2009) 8 - p. 1771-1775 , 2009
Link:
https://doi.org/10.1007/..
1-15