Buchheit, Thomas
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1

Recent Advances in Functional Data Analysis for Electronic ..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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2

Neutron Displacement Damage in Bipolar Junction Transistors..:

Young, Joshua M. ; Banerjee, Sneha ; Ho, Le Thanh Triet...
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 569-578 , 2024
 
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3

A Statistical Assessment of Zener Diode Behavior Using Func..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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5

Mean Estimation and Nominal Device Selection with the Pairw..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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6

Platelet-Rich Plasma and Autologous Conditioned Serum: Non-..:

, In: Neuroimmune Interactions in Pain,
Buchheit, Thomas - p. 287-303 , 2023
 
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8

Epidural blood patch: A narrative review:

Zetlaoui, Paul J. ; Buchheit, Thomas ; Benhamou, Dan
Anaesthesia Critical Care & Pain Medicine.  41 (2022)  5 - p. 101138 , 2022
 
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11

Contributors:

, In: Perioperative Medicine,
 
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12

Simplified Calculations of Radiation Dose-Rate Sensitivity ..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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13

Tolerance Bound Calculation for Compact Model Calibration U..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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