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Burchovetski, V. V.
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Structure imperfection and dielectric properties of single-..:

, In: 2016 IEEE 36th International Conference on Electronics and Nanotechnology (ELNANO),
Pashchenko, A. V. ; Liedienov, N. A. ; Burchovetski, V. V.... - p. 107-109 , 2016
Link: https://doi.org/10.1109/..
 
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