Search for persons
X
?
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
1
A Testbed for Cryogenic On-wafer Noise Measurement Using Co..:
, In:
?
2022 Asia-Pacific Microwave Conference (APMC) ,
3
A Low Power, Wideband Low-Noise Amplifier with Current-Reus..:
, In:
?
2019 IEEE Asia-Pacific Microwave Conference (APMC) ,
4
Large-Signal Characterization of Power FinFETs Based on X-P..:
, In:
?
IEEE MTT-S International Microwave Symposium Digest, 2005. ,
11