E-LIB Suche - Ergebnisse für: CODEGONI, D

1

Giant Spin‐Charge Conversion in Ultrathin Films of the MnPt..:

Longo, E. ; Markou, A. ; Felser, C....
Advanced Functional Materials. , 2024

Link: https://doi.org/10.1002/..

2

Unveiling Retention Physical Mechanism of Ge-rich GST ePCM ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Laurin, L. ; Baldo, M. ; Petroni, E.... - p. 1-7 , 2023

Link: https://doi.org/10.1109/..

3

BEOL Process Effects on ePCM Reliability:

Redaelli, A. ; Gandolfo, A. ; Samanni, G....
IEEE Journal of the Electron Devices Society. 10 (2022) - p. 563-568 , 2022

Link: https://doi.org/10.1109/..

4

Nanoscale reinforcement of polypropylene composites with ca..:

Petrova, I. ; Kotsilkova, R. ; Ivanov, E....
Polymer Engineering & Science. 56 (2015) 3 - p. 269-277 , 2015

Link: https://doi.org/10.1002/..

5

A comparative analysis of different measurement techniques ..:

Polignano, M. L. ; Codegoni, D. ; Grasso, S....
physica status solidi (a). 212 (2015) 3 - p. 495-505 , 2015

Link: https://doi.org/10.1002/..

6

Review—Characterization of Metal-Contamination Effects in S..:

Polignano, M. L. ; Codegoni, D. ; Galbiati, A....
ECS Journal of Solid State Science and Technology. 5 (2015) 4 - p. P3048-P3058 , 2015

Link: https://doi.org/10.1149/..

7

Palladium contamination in silicon:

Polignano, M.L. ; Mica, I. ; Ceresoli, M....
Solid-State Electronics. 106 (2015) - p. 68-77 , 2015

Link: https://doi.org/10.1016/..

8

Proximity gettering of slow diffuser contaminants in CMOS i..:

Russo, F. ; Moccia, G. ; Nardone, G....
Solid-State Electronics. 91 (2014) - p. 91-99 , 2014

Link: https://doi.org/10.1016/..

9

Tellurium Contamination in Silicon:

Polignano, M. L. ; Codegoni, D. ; Delcastello, G....
ECS Journal of Solid State Science and Technology. 2 (2012) 1 - p. N28-N34 , 2012

Link: https://doi.org/10.1149/..

10

F-66 Investigation of Spin-Coated Inorganic Contamination o..:

Beckhoff, B. ; Kolbe, M. ; Müller, M....
Powder Diffraction. 25 (2010) 2 - p. 215-215 , 2010

Link: https://doi.org/10.1154/..

11

F-49 Comparison of X-ray and Mass Spectroscopy Based Analyt..:

Nutsch, A. ; Leibold, A. ; Pfitzner, L....
Powder Diffraction. 25 (2010) 2 - p. 221-221 , 2010

Link: https://doi.org/10.1154/..

12

Behavior of irradiated BICMOS components for space applicat..:

, In: Recent Advances in Multidisciplinary Applied Physics,

CODEGONI, D ; COLDER, A ; CROITORU, N... - p. 587-591 , 2005

Link: https://doi.org/10.1016/..

13

Leakage current and deep levels in CoSi2 silicided junction:

Codegoni, D. ; Carnevale, G.P. ; De Marco, C...
Materials Science and Engineering: B. 124-125 (2005) - p. 349-353 , 2005

Link: https://doi.org/10.1016/..

14

Behavior of Irradiated BICMOS Components for Space Applicat..:

, In: Recent Advances in Multidisciplinary Applied Physics,

Codegoni, D. ; Colder, A. ; Croitoru, N.... - p. 587-591 , 2005

Link: https://doi.org/10.1016/..

15

Investigation of irradiated monolithic transistors for spac..:

Codegoni, D. ; Colder, A. ; Croitoru, N....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 217 (2004) 1 - p. 65-76 , 2004

Link: https://doi.org/10.1016/..