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Cai, Xiaowu
190  results:
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1

Engineering Sb/Zn4(OH)6SO4·5H2O interfacial layer by in sit..:

Xu, Mingyang ; Li, Jing ; Wang, Liyuan...
Journal of Colloid and Interface Science.  671 (2024)  - p. 742-750 , 2024
Link: https://doi.org/10.1016/..
 
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2

An integrated capacitor-less LDO with transient and stabili..:

Xie, Yafei ; Cai, Xiaowu ; Lu, Yu...
IEICE Electronics Express.  21 (2024)  9 - p. 20240199-20240199 , 2024
Link: https://doi.org/10.1587/..
 
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3

A Radiation-Hardened Overtemperature Protection Circuit Usi..:

Dang, Jianying ; Cai, Xiaowu ; Xie, Yafei...
IEEE Transactions on Nuclear Science.  71 (2024)  5 - p. 1202-1207 , 2024
Link: https://doi.org/10.1109/..
 
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4

A nMOS-R Cross-Coupled Level Shifter With High dV/dt Noise ..:

Lu, Yu ; Cai, Xiaowu ; Lu, Jian...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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5

A precision current sensing circuit with chopper amplifier ..:

Han, Tian ; Zhao, Fazhan ; Fu, Ximing...
Microelectronics Journal.  146 (2024)  - p. 106103 , 2024
Link: https://doi.org/10.1016/..
 
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6

A dual-mode buck converter with dynamic sawtooth voltage fo..:

Xie, Yafei ; Cai, Xiaowu ; Lu, Yu...
IEICE Electronics Express.  21 (2024)  12 - p. 20240148-20240148 , 2024
Link: https://doi.org/10.1587/..
 
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7

A Novel Reliability-Enhanced Dual Over-Temperature Protecti..:

Dang, Jianying ; Cai, Xiaowu ; Pan, Longli...
IEEE Transactions on Circuits and Systems II: Express Briefs.  71 (2024)  3 - p. 1471-1475 , 2024
Link: https://doi.org/10.1109/..
 
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8

Fully Integrated 1.8 V Output 300 mA Load LDO with Fast Tra..:

Gao, Mali ; Cai, Xiaowu ; Gao, Yuexin..
Electronics.  12 (2023)  6 - p. 1409 , 2023
Link: https://doi.org/10.3390/..
 
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9

Novel SenseFET structure for VDMOS with adopting body rever..:

Han, Tian ; Zhao, Fazhan ; Cai, Xiaowu...
Microelectronics Journal.  134 (2023)  - p. 105687 , 2023
Link: https://doi.org/10.1016/..
 
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10

Design of compact-diode-SCR with low-trigger voltage for fu..:

Gao, Yuexin ; Cai, Xiaowu ; Han, Zhengsheng...
Microelectronics Reliability.  140 (2023)  - p. 114860 , 2023
Link: https://doi.org/10.1016/..
 
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11

TID Effect of MOSFETs in SOI BCD Process and Its Hardening ..:

Wang, Shiping ; Li, Xiaojing ; Cai, Xiaowu...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1995-2001 , 2023
Link: https://doi.org/10.1109/..
 
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12

An on-chip integrated current sensor with high precision an..:

Xia, Ruirui ; Cai, Xiaowu ; Ding, Liqiang...
Microelectronics Journal.  134 (2023)  - p. 105686 , 2023
Link: https://doi.org/10.1016/..
 
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13

Investigation on performance degradation mechanism of GaN p..:

Tang, Yun ; Wang, Lei ; Cai, Xiaowu..
Applied Physics Letters.  122 (2023)  2 - p. , 2023
Link: https://doi.org/10.1063/..
 
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14

A high reliability under-voltage lock out circuit for power..:

Ding, Liqiang ; Cai, Xiaowu ; Gao, Mali..
Integration.  88 (2023)  - p. 166-172 , 2023
Link: https://doi.org/10.1016/..
 
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15

Synergistic Effect of Negative Bias Instability and Total I..:

Tang, Yun ; Wang, Lei ; Cai, Xiaowu...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1990-1994 , 2023
Link: https://doi.org/10.1109/..
 
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