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Camalleri, Marco
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1
Impact of the NO annealing duration on the SiO2/4H–SiC inte..:
Fiorenza, Patrick
;
Zignale, Marco
;
Camalleri, Marco
...
Materials Science in Semiconductor Processing. 169 (2024) - p. 107866 , 2024
Link:
https://doi.org/10.1016/..
?
2
Evolution of Interface State Density and Near Interface Oxi..:
Fiorenza, Patrick
;
Camalleri, Marco
;
Scalia, Laura
...
Materials Science Forum. 1090 (2023) - p. 113-117 , 2023
Link:
https://doi.org/10.4028/..
?
3
Study of the Post-Oxidation-Annealing (POA) Process on Depo..:
Severino, Andrea
;
Piluso, Nicolo
;
di Stefano, Maria Ausilia
...
Materials Science Forum. 963 (2019) - p. 456-459 , 2019
Link:
https://doi.org/10.4028/..
?
4
Interface states and traps in thin N2O-grown oxynitride/oxi..:
Currò, Giuseppe
;
Camalleri, Marco
;
Calì, Denise
..
Microelectronics Reliability. 47 (2007) 4-5 - p. 819-821 , 2007
Link:
https://doi.org/10.1016/..
?
5
Carrier trapping in thin N2O-grown oxynitride/oxide di-laye..:
Currò, Giuseppe
;
Camalleri, Marco
;
Calì, Denise
..
Microelectronics Reliability. 47 (2007) 4-5 - p. 798-801 , 2007
Link:
https://doi.org/10.1016/..
?
6
Material modifications induced by laser annealing in two-di..:
La Magna, Antonino
;
Alippi, Paola
;
Privitera, Vittorio
...
Applied Physics Letters. 84 (2004) 23 - p. 4738-4740 , 2004
Link:
https://doi.org/10.1063/..
?
7
A phase-field approach to the simulation of the excimer las..:
La Magna, Antonino
;
Alippi, Paola
;
Privitera, Vittorio
...
Journal of Applied Physics. 95 (2004) 9 - p. 4806-4814 , 2004
Link:
https://doi.org/10.1063/..
?
8
Computational methods for the simulation of the excimer las..:
Magna, Antonino La
;
Alippi, Paola
;
Mannino, G.
...
Materials Science and Engineering: B. 114-115 (2004) - p. 100-104 , 2004
Link:
https://doi.org/10.1016/..
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