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Camalleri, Marco
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1

Impact of the NO annealing duration on the SiO2/4H–SiC inte..:

Fiorenza, Patrick ; Zignale, Marco ; Camalleri, Marco...
Materials Science in Semiconductor Processing.  169 (2024)  - p. 107866 , 2024
Link: https://doi.org/10.1016/..
 
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2

Evolution of Interface State Density and Near Interface Oxi..:

Fiorenza, Patrick ; Camalleri, Marco ; Scalia, Laura...
Materials Science Forum.  1090 (2023)  - p. 113-117 , 2023
Link: https://doi.org/10.4028/..
 
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3

Study of the Post-Oxidation-Annealing (POA) Process on Depo..:

Severino, Andrea ; Piluso, Nicolo ; di Stefano, Maria Ausilia...
Materials Science Forum.  963 (2019)  - p. 456-459 , 2019
Link: https://doi.org/10.4028/..
 
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4

Interface states and traps in thin N2O-grown oxynitride/oxi..:

Currò, Giuseppe ; Camalleri, Marco ; Calì, Denise..
Microelectronics Reliability.  47 (2007)  4-5 - p. 819-821 , 2007
Link: https://doi.org/10.1016/..
 
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5

Carrier trapping in thin N2O-grown oxynitride/oxide di-laye..:

Currò, Giuseppe ; Camalleri, Marco ; Calì, Denise..
Microelectronics Reliability.  47 (2007)  4-5 - p. 798-801 , 2007
Link: https://doi.org/10.1016/..
 
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6

Material modifications induced by laser annealing in two-di..:

La Magna, Antonino ; Alippi, Paola ; Privitera, Vittorio...
Applied Physics Letters.  84 (2004)  23 - p. 4738-4740 , 2004
Link: https://doi.org/10.1063/..
 
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7

A phase-field approach to the simulation of the excimer las..:

La Magna, Antonino ; Alippi, Paola ; Privitera, Vittorio...
Journal of Applied Physics.  95 (2004)  9 - p. 4806-4814 , 2004
Link: https://doi.org/10.1063/..
 
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8

Computational methods for the simulation of the excimer las..:

Magna, Antonino La ; Alippi, Paola ; Mannino, G....
Materials Science and Engineering: B.  114-115 (2004)  - p. 100-104 , 2004
Link: https://doi.org/10.1016/..
 
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