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Camus, Patrick
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1

The Detector Efficiency Question with EDS:

Eggert, Frank ; Rafaelsen, Jens ; Reinauer, Felix..
Microscopy and Microanalysis.  27 (2021)  S1 - p. 1674-1676 , 2021
Link: https://doi.org/10.1017/..
 
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2

Bremsstrahlung Background Modeling Without Fit Regions:

Eggert, Frank ; Camus, Patrick
Microscopy and Microanalysis.  26 (2020)  S2 - p. 2178-2180 , 2020
Link: https://doi.org/10.1017/..
 
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3

The Detectors Response of an EDS Spectrometer in Low Energy..:

Eggert, Frank ; Gernert, Ulrich ; Reinauer, Felix.
Microscopy and Microanalysis.  26 (2020)  S2 - p. 1552-1553 , 2020
Link: https://doi.org/10.1017/..
 
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4

Blockchain and Initial Coin Offerings: Blockchain's Implica..:

, In: Business Transformation through Blockchain,
Arnold, Laurin ; Brennecke, Martin ; Camus, Patrick... - p. 233-272 , 2018
Link: https://doi.org/10.1007/..
 
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5

EDAX - More Than 50 Years of Influence On Microanalysis:

Camus, Patrick ; Nylese, Tara
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1020-1021 , 2017
Link: https://doi.org/10.1017/..
 
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6

Current Status of ISO/TC202 - Microbeam Analysis:

Camus, Patrick ; Meier, Douglas ; Marinenko, Ryna
Microscopy and Microanalysis.  23 (2017)  S1 - p. 490-491 , 2017
Link: https://doi.org/10.1017/..
 
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7

Electron imaging with an EBSD detector:

Wright, Stuart I. ; Nowell, Matthew M. ; de Kloe, René..
Ultramicroscopy.  148 (2015)  - p. 132-145 , 2015
Link: https://doi.org/10.1016/..
 
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8

Factors Affecting WDS Performance Superiority over EDS:

Camus, Patrick
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1629-1630 , 2015
Link: https://doi.org/10.1017/..
 
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9

Improved EBSD Map Fidelity through Re-indexing of Neighbor ..:

Wright, Stuart I. ; Nowell, Matthew M. ; Lindeman, Scott P..
Microscopy and Microanalysis.  21 (2015)  S3 - p. 2373-2374 , 2015
Link: https://doi.org/10.1017/..
 
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10

A Comparison of Cross Section Formulas and their Effect on ..:

Sandborg, Alan ; Camus, Patrick ; Hammell, Brent
Microscopy and Microanalysis.  20 (2014)  S3 - p. 612-613 , 2014
Link: https://doi.org/10.1017/..
 
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11

Using Accurate Solid Angle Tools when Comparing EDS Detecto..:

Camus, Patrick ; Buchhold, Reinhard
Microscopy and Microanalysis.  20 (2014)  S3 - p. 900-901 , 2014
Link: https://doi.org/10.1017/..
 
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12

Impact of 40 Years of Technology Advances on EDS System Per..:

McCarthy, Jon ; Friel, John ; Camus, Patrick
Microscopy and Microanalysis.  15 (2009)  6 - p. 484-490 , 2009
Link: https://doi.org/10.1017/..
 
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13

Methods of Maximizing X-ray Detection in SEMs:

Rohde, David ; Camus, Patrick
Microscopy Today.  15 (2007)  6 - p. 16-17 , 2007
Link: https://doi.org/10.1017/..
 
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14

Investigating the Microstructure of a Newly Developed Alumi..:

Camus, Patrick ; Rohde, David
Microscopy Today.  14 (2006)  1 - p. 42-45 , 2006
Link: https://doi.org/10.1017/..
 
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15

Quantitative X-Ray Mapping in the TEM for Nanotechnology:

Camus, Patrick ; Suzuki, Minoru
Microscopy and Microanalysis.  10 (2004)  S02 - p. 542-543 , 2004
Link: https://doi.org/10.1017/..
 
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