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Canflanca, B.
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1

Hot stamping of aerospace aluminium alloys: Automotive tech..:

Atxaga, G. ; Arroyo, A. ; Canflanca, B.
Journal of Manufacturing Processes.  81 (2022)  - p. 817-827 , 2022
Link: https://doi.org/10.1016/..
 
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2

Corrosion and environmental degradation of bonded composite..:

Gkikas, G. ; Paipetis, A. ; Lekatou, A....
International Journal of Structural Integrity.  4 (2013)  1 - p. 67-77 , 2013
Link: https://doi.org/10.1108/..
 
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3

Statistical Characterization of Off-State Stress Degradatio..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Saraza-Canflanca, P. ; Sangani, D. ; Diaz-Fortuny, J.... - p. 8A.2-1-8A.2-9 , 2024
Link: https://doi.org/10.1109/..
 
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4

Exploiting Bias Temperature Instability for Reservoir Compu..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Guo, Y. ; Degraeve, R. ; Vandemaele, M.... - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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5

Unveiling the Vulnerability of Oxide-Breakdown-Based PUF:

Saraza-Canflanca, P. ; Fodor, F. ; Diaz-Fortuny, J....
IEEE Electron Device Letters.  45 (2024)  5 - p. 750-753 , 2024
Link: https://doi.org/10.1109/..
 
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6

Towards Complete Recovery of Circuit Degradation by Anneali..:

Diaz-Fortuny, J. ; Saraza-Canflanca, P. ; Lofrano, M....
IEEE Electron Device Letters.  44 (2023)  2 - p. 201-204 , 2023
Link: https://doi.org/10.1109/..
 
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7

Using dedicated device arrays for the characterization of T..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Saraza-Canflanca, P. ; Diaz-Fortuny, J. ; Vici, A.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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8

Dedicated ICs for the Characterization of Variability and A..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Diaz-Fortuny, J. ; Saraza-Canflanca, P. ; Vandemaele, M.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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