Capello, D.
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1

An Autonomous Wireless Platform for the Remote Inspection o..:

, In: Complex, Intelligent and Software Intensive Systems; Advances in Intelligent Systems and Computing,
Ciccia, S. ; Caragnano, G. ; Bertone, F.... - p. 120-129 , 2020
 
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Quantification of the number of Si interstitials formed by ..:

Darras, F.-X. ; Cherkashin, N. ; Cristiano, F....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  327 (2014)  - p. 29-32 , 2014
 
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Structural properties of ultra-low-energy ion-implanted sil..:

Capello, L. ; Metzger, T. H. ; Holý, V...
Journal of Applied Crystallography.  39 (2006)  4 - p. 571-581 , 2006
 
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12

An Integrated Design and Verification Methodology for Recon..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 3,
Borgatti, M. ; Capello, A. ; Rossi, U.... - p. 266-271 , 2005
 
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13

Solid-phase epitaxial regrowth of a shallow amorphised Si l..:

Capello, L. ; Metzger, T.H. ; Werner, M....
Materials Science and Engineering: B.  124-125 (2005)  - p. 200-204 , 2005
 
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Evolution of end-of-range defects in Si after Xe implantati..:

Capello, L. ; Metzger, T.H.
Materials Science and Engineering: B.  114-115 (2004)  - p. 77-81 , 2004
 
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15

Risultati clinici del trattamento endovascolare di aneurism..:

Mavilio, N. ; Testa, V. ; Allegretti, L...
Rivista di Neuroradiologia.  16 (2003)  2_suppl_part1 - p. 149-152 , 2003
 
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