E-LIB Suche - Ergebnisse für: Carlo De Santi

1

Modeling the Electrical Degradation of Micro-transfer-Print..:

Zenari, Michele ; Buffolo, Matteo ; De Santi, Carlo...
IEEE Transactions on Electron Devices. 71 (2024) 2 - p. 1131-1138 , 2024

Link: https://doi.org/10.1109/..

2

Modeling of the Electrical Characteristics and Degradation ..:

Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo...
IEEE Photonics Journal. 16 (2024) 1 - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

3

Advanced Defect Spectroscopy in Wide Bandgap Semicondutors:..:

Fregolent, Manuel ; Piva, Francesco ; Buffolo, Matteo...
Journal of Physics D: Applied Physics. , 2024

Link: https://doi.org/10.1088/..

4

Investigation of degradation dynamics of 265 nm LEDs assist..:

Piva, Francesco ; Buffolo, Matteo ; Roccato, Nicola...
Semiconductor Science and Technology. 39 (2024) 7 - p. 075025 , 2024

Link: https://doi.org/10.1088/..

5

V-Pits and Trench-Like Defects in High Periodicity MQWs GaN..:

Nicoletto, Marco ; Caria, Alessandro ; Rampazzo, Fabiana...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 2051-2057 , 2024

Link: https://doi.org/10.1109/..

6

TCAD Modeling and Simulation of Dark Current-Voltage Charac..:

Nicoletto, Marco ; Caria, Alessandro ; De Santi, Carlo...
IEEE Journal of Photovoltaics. 14 (2024) 3 - p. 450-458 , 2024

Link: https://doi.org/10.1109/..

7

On the CET-Map Ill-Posed Inversion Problem: Theory and Appl..:

Modolo, Nicola ; De Santi, Carlo ; Baratella, Giulio...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1646-1653 , 2024

Link: https://doi.org/10.1109/..

8

Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:

Zanoni, Enrico ; De Santi, Carlo ; Gao, Zhan...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1396-1407 , 2024

Link: https://doi.org/10.1109/..

9

Fast Characterization of Power LEDs: Circuit Design and Exp..:

Roccato, Nicola ; Piva, Francesco ; Buffolo, Matteo...
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3753-3760 , 2024

Link: https://doi.org/10.1109/..

10

Impact of the oxide aperture width on the degradation of 84..:

Zenari, Michele ; Buffolo, Matteo ; Rampazzo, Fabiana...
IEEE Journal of Selected Topics in Quantum Electronics. , 2024

Link: https://doi.org/10.1109/..

11

Correlating Interface and Border Traps With Distinctive Fea..:

Zagni, Nicolò ; Fregolent, Manuel ; Verzellesi, Giovanni...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1561-1566 , 2024

Link: https://doi.org/10.1109/..

12

Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobil..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Saro, Marco ; de Pieri, Francesco ; Carlotto, Andrea... - p. 5B.2-1-5B.2-8 , 2024

Link: https://doi.org/10.1109/..

13

Positive VTH Shift in Schottky p-GaN Gate Power HEMTs: Depe..:

Modolo, Nicola ; De Santi, Carlo ; Sicre, Sebastien...
IEEE Transactions on Power Electronics. 39 (2024) 6 - p. 7045-7051 , 2024

Link: https://doi.org/10.1109/..

14

Modeling the electrical degradation of AlGaN-based UV-C LED..:

Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo...
Applied Physics Letters. 122 (2023) 16 - p. , 2023

Link: https://doi.org/10.1063/..

15

Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-..:

Zagni, Nicolò ; Gao, Veronica Zhan ; Verzellesi, Giovanni...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 4 - p. 453-460 , 2023

Link: https://doi.org/10.1109/..