Carretero-Genevrier, Adrian
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7

Characterizing Ferroelectricity with an Atomic Force Micros..:

, In: Electrical Atomic Force Microscopy for Nanoelectronics; NanoScience and Technology,
Martin, Simon ; Gautier, Brice ; Baboux, Nicolas... - p. 173-203 , 2019
 
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10

Epitaxial La0.7Sr0.3MnO3thin films on silicon with excellen..:

Vila-Fungueiriño, José Manuel ; Gázquez, Jaume ; Magén, César...
Science and Technology of Advanced Materials.  19 (2018)  1 - p. 702-710 , 2018
 
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12

Thermoelectric La-doped SrTiO3epitaxial layers with single-..:

Apreutesei, Mihai ; Debord, Régis ; Bouras, Mohamed...
Science and Technology of Advanced Materials.  18 (2017)  1 - p. 430-435 , 2017
 
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