Castilla, Elena
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2

A new estimation approach based on phi‐divergence measures ..:

Castilla, Elena
Quality and Reliability Engineering International.  40 (2024)  4 - p. 2048-2066 , 2024
 
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3

Robust Circular Logistic Regression Model and Its Applicati..:

Castilla, Elena
Revista Colombiana de Estadística.  46 (2023)  1 - p. 45-62 , 2023
 
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Robust inference for nondestructive one‐shot device testing..:

Balakrishnan, Narayanaswamy ; Castilla, Elena ; Jaenada, María.
Quality and Reliability Engineering International.  39 (2023)  4 - p. 1192-1222 , 2023
 
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A New Robust Approach for Multinomial Logistic Regression W..:

Castilla, Elena ; Chocano, Pedro J.
IEEE Transactions on Information Theory.  68 (2022)  11 - p. 7379-7395 , 2022
 
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Combinatoria:

Chocano, Pedro ; Castilla, Elena
Forum Docentis.  1 (2022)  1 - p. 45-54 , 2022
 
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9

On distance-type Gaussian estimation:

Castilla, Elena ; Zografos, Konstantinos
Journal of Multivariate Analysis.  188 (2022)  - p. 104831 , 2022
 
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10

On the Choice of the Optimal Tuning Parameter in Robust One..:

, In: Trends in Mathematical, Information and Data Sciences; Studies in Systems, Decision and Control,
Castilla, Elena ; Chocano, Pedro J. - p. 169-180 , 2022
 
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Estimation and Testing on Independent Not Identically Distr..:

Castilla, Elena ; Jaenada, Maria ; Pardo, Leandro
IEEE Transactions on Information Theory.  68 (2022)  7 - p. 4588-4609 , 2022
 
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EM‐based likelihood inference for one‐shot device test data..:

Balakrishnan, Narayanaswamy ; Castilla, Elena
Quality and Reliability Engineering International.  38 (2021)  2 - p. 780-799 , 2021
 
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14

Optimal designs of constant‐stress accelerated life‐tests f..:

Balakrishnan, Narayanaswamy ; Castilla, Elena ; Ling, Man Ho
Quality and Reliability Engineering International.  38 (2021)  2 - p. 989-1012 , 2021
 
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Robust inference for one‐shot device testing data under exp..:

Balakrishnan, Narayanaswamy ; Castilla, Elena ; Martín, Nirian.
Quality and Reliability Engineering International.  36 (2020)  6 - p. 1916-1930 , 2020
 
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