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2020 IEEE International Reliability Physics Symposium (IRPS) ,
12
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Nod:
, In:
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2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
13
Novel FPGA Radiation Benchmarking Structures:
, In:
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2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
14