Cerdeira, A. L.
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1

On the compact modelling of Si nanowire and Si nanosheet MO..:

Cerdeira, A ; Estrada, M ; Pavanello, M A
Semiconductor Science and Technology.  37 (2022)  2 - p. 025014 , 2022
 
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Dynamic Simulation of a-IGZO TFT Circuits Using the Analyti..:

Hernandez-Barrios, Y. ; Gaspar-Angeles, J. N. ; Estrada, M...
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 464-468 , 2021
 
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High Mobility Hf-In-ZnO TFTs, with HfO2 as Dielectric for L..:

, In: 2021 IEEE Latin America Electron Devices Conference (LAEDC),
 
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Dynamic Validation of the Full Model for AOSTFTs using a Ri..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
 
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Parameter extraction and compact drain current model for IG..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
Cortes-Ordonez, H. ; Muhea, W. E. ; Mescot, X.... - p. 1-5 , 2020
 
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8

Quality Control Relevance on Acquisition of Large Scale Geo..:

, In: 2020 IEEE Latin American GRSS & ISPRS Remote Sensing Conference (LAGIRS),
Filho, A. G. G. ; Borba, P. ; Silva, V. H. S... - p. 138-142 , 2020
 
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Parameter extraction and compact drain current model for IG..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
Cortes-Ordonez, H. ; Muhea, W. E. ; Mescot, X.... - p. 1-5 , 2020
 
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10

Application of the Symmetric Doped Double-Gate Model in Cir..:

Contreras, E. ; Cerdeira, A. ; Alvarado, J..
Journal of Integrated Circuits and Systems.  5 (2020)  2 - p. 110-115 , 2020
 
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QUALITY CONTROL RELEVANCE ON ACQUISITION OF LARGE SCALE GEO..:

Filho, A. G. G. ; Borba, P. ; Silva, V. H. S...
The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences.  XLII-3/W12-2020 (2020)  - p. 25-29 , 2020
 
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