Chaitanya Bhure
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5

Automated Transfer Learning Model for Counterfeit IC Detect..:

, In: 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE),
 
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9

Synthesizing fatal crashes involving partially automated ve..:

Hardik Gajera ; Srinivas S. Pulugurtha ; Sonu Mathew.
http://www.sciencedirect.com/science/article/pii/S2666691X23000180.  , 2023
 
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