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Champac, V.
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1

Identification of Logic Paths Influenced by Severe Coupling..:

Meza-Ibarra, I. D. ; Champac, V. ; Gomez-Fuentes, R...
Journal of Electronic Testing.  36 (2020)  6 - p. 731-741 , 2020
Link: https://doi.org/10.1007/..
 
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2

Effectiveness of a hardware-based approach to detect resist..:

Gomez, A.F. ; Lavratti, F. ; Medeiros, G....
Microelectronics Reliability.  67 (2016)  - p. 150-158 , 2016
Link: https://doi.org/10.1016/..
 
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3

Process Variations-Aware Statistical Analysis Framework for..:

Vazquez, J. C. ; Champac, V. ; Semião, J....
Journal of Electronic Testing.  29 (2013)  3 - p. 289-299 , 2013
Link: https://doi.org/10.1007/..
 
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4

Delay sensing for long-term variations and defects monitori..:

Vazquez, J. C. ; Champac, V. ; Ziesemer Jr., A. M....
Analog Integrated Circuits and Signal Processing.  70 (2011)  2 - p. 249-263 , 2011
Link: https://doi.org/10.1007/..
 
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5

Programmable aging sensor for automotive safety-critical ap..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Vazquez, J. C. ; Champac, V. ; Teixeira, I. C... - p. 618-621 , 2010
Link: https://dl.acm.org/doi/1..
 
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6

A Graph-Oriented CAD Tool for Establishing the Topological ..:

, In: Proceedings of the 11th Brazilian Symposium on Integrated circuit design,
Sarmiento-Reyes, A. ; Anda, M. Gutierrez-de ; Champac, V. - p. 179 ff. , 1998
Link: https://dl.acm.org/doi/1..
 
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7

Impact of aging on the SEU immunity of FinFET-based embedde..:

Constante, A.A. ; Balen, T.R. ; Champac, V.H...
Microelectronics Reliability.  150 (2023)  - p. 115229 , 2023
Link: https://doi.org/10.1016/..
 
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8

Quiescent current analysis and experimentation of defective..:

Segura, J. A. ; Champac, V. H. ; Rodr�guez-Monta��s, R...
Journal of Electronic Testing.  3 (1992)  4 - p. 337-348 , 1992
Link: https://doi.org/10.1007/..
 
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9

Aging-Aware Power or Frequency Tuning With Predictive Fault..:

Pachito, Jackson ; Martins, Celestino V. ; Jacinto, Bruno...
IEEE Design & Test of Computers.  29 (2012)  5 - p. 27-36 , 2012
Link: https://doi.org/10.1109/..
 
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