Chang, Chao-Wei
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ESD Reliability in Advanced Nodes:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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14

Prospects of Coffee Leaf against SARS-CoV-2 Infection:

Wu, Chen-Shiou ; Chiang, Hsiu-Mei ; Chen, Yeh...
International Journal of Biological Sciences.  18 (2022)  12 - p. 4677-4689 , 2022
 
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