Chang, Jonathan L.
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2

On-Wafer FinFET-Based 3-D E-Beam Detector Cube for In Situ ..:

Teng, Yu-Jie ; Chao, Ho-Ting ; Chang, Wei...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3739-3745 , 2024
 
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3

Advanced self-convergent calibration for selenized two-dime..:

Liu, Che-Chuan ; Shen, Hsin-Yi ; Wang, Kuangye...
Japanese Journal of Applied Physics.  63 (2024)  2 - p. 02SP34 , 2024
 
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5

A New Ultra-Low Voltage Metal Fuse for High Density OTP App..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Wang, Li-Yu ; Chen, Kuan-Ju ; Yuh, Perng-Fei... - p. 1-2 , 2024
 
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Application of twin-bit self-rectifying via RRAM with uniqu..:

Lin, Yu-Cheng ; Huang, Yao-Hung ; Chuang, Kai-Ching...
Japanese Journal of Applied Physics.  63 (2024)  2 - p. 02SP55 , 2024
 
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High-Density Embedded 3-D Stackable Via RRAM in 16-nm FinFE..:

Huang, Yao-Hung ; Hsieh, Yu-Cheng ; Lin, Yu-Cheng...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3614-3619 , 2024
 
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10

4K Detectors Array for On-Wafer EUV Imaging in Lithography ..:

Chang, Wei ; Wang, Chien-Ping ; Huang, Yao-Hung...
IEEE Transactions on Electron Devices.  70 (2023)  11 - p. 5713-5719 , 2023
 
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14

16nm FinFET DUV Detector Array in Fully Compatible FinFET L..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
 
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