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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
1
Transformer and Its Variants for Identifying Good Dice in B..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
2
Outlier Detection for Analog Tests Using Deep Learning Tech..:
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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
5
Test Methodology for Defect-based Bridge Faults:
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Innovative Mobile and Internet Services in Ubiquitous Computing; Advances in Intelligent Systems and Computing ,
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A LoRaWAN Based Energy Efficient Data Encryption Method:
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Lecture Notes on Data Engineering and Communications Technologies; Advances on Broadband and Wireless Computing, Communication and Applications ,
14